M38510/20704BEA QP SEMICONDUCTOR, M38510/20704BEA Datasheet - Page 2

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M38510/20704BEA

Manufacturer Part Number
M38510/20704BEA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of M38510/20704BEA

Lead Free Status / RoHS Status
Not Compliant
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of
this specification, whether or not they are listed.
specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those
cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
DEPARTMENT OF DEFENSE STANDARDS
http://assist.daps.dla.mil
Philadelphia, PA 19111-5094.)
____
1/
2/
3/
1.3 Absolute maximum ratings.
1.4 Recommended operating conditions.
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
2.2 Government documents.
2.2.1 Specifications and Standards. The following specifications and standards form a part of this
(Copies of these documents are available online at
Heat sinking is recommended to reduce the junction temperature.
Must withstand the added P
Maximum junction temperature shall not be exceeded except for allowable short duration burn-in
screening conditions per method 5004 of MIL-STD-883.
Supply voltage range .................................................................... -0.5 V dc to +7.0 V dc
Input voltage range ....................................................................... -1.5 V dc at -10 mA to +5.5 V dc
Storage temperature range ........................................................... -65° to +150°C
Lead temperature (soldering, 10 seconds) .................................... +300°C
Thermal resistance, junction to case (
Output voltage applied .................................................................. -0.5 V dc to +V
Output sink current ........................................................................ 100 mA
Maximum power dissipation (P
Maximum junction temperature (T
Supply voltage range (V
Minimum high-level input voltage (V
Maximum low-level input voltage (V
Normalized fanout (each output) ................................................... 16 mA
Case operating temperature range (T
MIL-PRF-38535 -
MIL-STD-883
MIL-STD-1835
Cases E and F ........................................................................ See MIL-STD-1835 1/
or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
-
-
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
Test Method Standard for Microelectronics.
Interface Standard Electronic Component Case Outline
CC
D
) .......................................................... +4.5 V dc minimum to
due to short circuit test (e.g. I
D
) .................................................. 739 mW dc 2/
J
) .............................................. +175°C 3/
IL
IH
) .......................................... 0.8 V dc
C
θ
) ......................................... 2.0 V dc
) ........................................ -55 °C to +125 °C
JC
MIL-M-38510/207E
):
http://assist.daps.dla.mil/quicksearch/
2
OS
).
+5.5 V dc maximum
CC
or

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