M38510/20704BEA QP SEMICONDUCTOR, M38510/20704BEA Datasheet

Page 1

MICROCIRCUIT, DIGITAL, 256-BIT, SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet ...

Page 2

Absolute maximum ratings. Supply voltage range .................................................................... -0 +7 Input voltage range ....................................................................... - Storage temperature range ........................................................... -65° to +150°C Lead temperature (soldering, 10 ...

Page 3

Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a ...

Page 4

TABLE I Test Symbol High-level output voltage Low-level output voltage Input clamp voltage Maximum collector cut-off current High impedance (off-state) output high current High impedance (off-state) output low current High level input current Low level input current Short circuit output ...

Page 5

MIL-M-38510/207E Device types 01, 02, 03, and 04 Case outlines E and F Terminal number Terminal symbol GND FIGURE 1. Terminal connections. 5 ...

Page 6

Word CE number Word number NOTES Not applicable Input may be high level, low level or open circuit Open ...

Page 7

MIL-M-38510/207E FIGURE 3. Functional block diagrams. 7 ...

Page 8

MIL-M-38510/207E NOTE: This circuit is also used as circuit H. FIGURE 3. Functional block diagrams – Continued. 8 ...

Page 9

MIL-M-38510/207E FIGURE 3. Functional block diagrams – Continued. 9 ...

Page 10

NOTES: 1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory minimum, including ...

Page 11

MIL-M-38510/207E NOTE: All other waveform characteristics shall be as specified in table IVA. FIGURE 5A. Typical programming voltage waveforms during programming for circuit A. 11 ...

Page 12

NOTES: 1. Output load is 0.2 mA and 12 mA during 7.0 V and 4.0 V check respectively. 2. All other waveform characteristics shall be as specified in table IVB. FIGURE 5B. Typical programming voltage waveforms during programming for circuit ...

Page 13

MIL-M-38510/207E NOTE: All other waveform characteristics shall be as specified in tables IVC. FIGURE 5C. Typical programming voltage waveforms during programming for circuit C. 13 ...

Page 14

MIL-M-38510/207E FIGURE 5D. Typical programming voltage waveforms during programming for circuit G. 14 ...

Page 15

NOTES: 1. All other waveform characteristics shall be as specified in tables IVH. 2. Programming verification at both high and low V can also be executed at the operating V FIGURE 5E. Typical programming voltage waveforms during programming for circuit ...

Page 16

VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF- 38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, ...

Page 17

MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters for unprogrammed devices Final electrical test parameters for programmed devices Group A test requirements Group B end-point electrical parameters when using the method 5005 QCI option Group C end-point electrical ...

Page 18

Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; MIL- Cases STD- E,F Subgroup Symbol 883 Test method no ...

Page 19

Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; MIL- Cases STD- E,F Subgroup Symbol 883 Test method no. 7 Func ...

Page 20

Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; MIL- Cases STD- E,F Subgroup Symbol 883 Test method no ...

Page 21

Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; MIL- Cases STD- E,F Subgroup Symbol 883 Test method no 0.5V I OLZ 44 0.5V ...

Page 22

For programmed devices, select an appropriate address to acquire the desired output state 2 For unprogrammed devices, apply 11 pins For unprogrammed 02 devices ( V 4/ ...

Page 23

SEQUENTIAL (PROGRAMMED PROM). This program will test all bits in the array for t Description: Step 1. Each word in the pattern is tested from the enable lines to the output lines for recovery. Step 2. Word 0 is ...

Page 24

Methods of inspection. Methods of inspection shall be specified and as follows: 4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional and positive when flowing into the referenced terminal. 4.6 ...

Page 25

TABLE IVA. Programming characteristics for circuit A. Parameter Symbol V Address input voltage 2/ V Programming V PH Voltage to V low Program verify V PHV Verify voltage V R Programming input low I ILP current at ...

Page 26

Programming procedure for circuit B. The programming characteristics in table IVB and the following procedures shall be used for programming the devices: a. Connect the device in the electrical configuration for programming. The waveforms on figure 5B and the ...

Page 27

TABLE IVB. Programming characteristics for circuit B. Parameter Symbol Current into output during programming before the fuse has programmed Current into output during programming after the fuse has programmed Rise time of program pulse applied to the data out from ...

Page 28

Programming procedure for circuit C. The programming characteristics in table IVC and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration for programming. The waveforms on figure 5C and the programming ...

Page 29

TABLE IVC. Programming characteristics for circuit C. Parameter Symbol Programming voltage to V CCP V CC Verification upper limit V CCH Verification lower limit V CCL Verify threshold V S Programming supply I CCP current Input voltage high level V ...

Page 30

Programming procedure for circuit G. The programming characteristics on table IVG and the following procedures shall be used for programming. a. Connect the device in the electrical configuration of programming. The waveforms on figure 5D and the programming characteristics ...

Page 31

TABLE IVG. Programming characteristics for circuit G. Parameter Symbol Required V for V CC CCP programming I CCP I during programming CC Required output voltage V OP for programming Output current while I OP programming Rate of voltage change I ...

Page 32

Programming procedure for circuit H. The programming characteristics in table IVH and the following procedures shall apply for programming the device: a. Connect the device in the electrical configuration for programming. The waveforms on figure 5E and the programming ...

Page 33

TABLE IVH. Programming characteristics for circuit H. Parameter Symbol Programming voltage V CCP Verification upper limit V CCVH Verification normal limit V CCVN Verification lower limit V CCVL Verify threshold V S Programming supply I CCP current ...

Page 34

PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel performed by DoD or in-house contractor personnel, these personnel need to ...

Page 35

... Signetics Corporation, CAGE 18324 01, 03 82S23A/QP Semiconductor 02, 04 82S123A / Signetics Corporation, CAGE 18324 02, 04 82S123A/QP Semiconductor 1/ This generic industry type is no longer manufactured. 2/ Updated circuit C to circuit H to reflect the current programming method. Contact the manufacturer for the correct programming method being used. ...

Page 36

Change from previous issue. Marginal notations are used in this revision to identify changes with respect to the previous issue. Custodians: Army - CR Navy - EC Air Force - 11 DLA - CC Review activities: Army – SM, ...