TZA3046UN1 NXP Semiconductors, TZA3046UN1 Datasheet - Page 11
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TZA3046UN1
Manufacturer Part Number
TZA3046UN1
Description
Manufacturer
NXP Semiconductors
Datasheet
1.TZA3046UN1.pdf
(15 pages)
Specifications of TZA3046UN1
Operating Temperature (min)
-40C
Operating Temperature (max)
85C
Operating Temperature Classification
Industrial
Lead Free Status / RoHS Status
Compliant
Fig 9. Test circuit
Total impedance of the test circuit (Z
Typical values: R = 330 , Z
GENERATOR
PATTERN
CLOCK
DATA
i
= 30 .
DC-IN
tot(tc)
) is calculated by the equation Z
55
22 nF
8.2
k
330
R
IPHOTO
tot(tc)
2
9, 10, 11, 12
TZA3046
4 or 17
= s
V
CC
GND
21
8 or 14
7 or 13
(R + Z
S-PARAMETER TEST SET
NETWORK ANALYZER
PORT1
OUT
OUTQ
Z
i
)
o
= 50
2, where s
22 nF
22 nF
PORT2
21
Z
o
is the insertion loss of ports 1 and 2.
= 50
SAMPLING OSCILLOSCOPE
Z
o
= 50
1
2
001aae519
TRIGGER
INPUT