STK12C68-5L55M Cypress Semiconductor Corp, STK12C68-5L55M Datasheet - Page 9

STK12C68-5L55M

STK12C68-5L55M

Manufacturer Part Number
STK12C68-5L55M
Description
STK12C68-5L55M
Manufacturer
Cypress Semiconductor Corp
Type
NVSRAMr
Datasheets

Specifications of STK12C68-5L55M

Format - Memory
RAM
Memory Type
NVSRAM (Non-Volatile SRAM)
Memory Size
64K (8K x 8)
Speed
35ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-55°C ~ 125°C
Package / Case
28-LCC
Word Size
8b
Organization
8Kx8
Density
64Kb
Interface Type
Parallel
Access Time (max)
55ns
Operating Supply Voltage (typ)
5V
Package Type
CLCC
Operating Temperature Classification
Military
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
4.5V
Operating Temp Range
-55C to 125C
Pin Count
28
Mounting
Surface Mount
Supply Current
75mA
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
STK12C68-5L55M
Quantity:
7
Part Number:
STK12C68-5L55M
Manufacturer:
XICOR
Quantity:
110
Data Retention and Endurance
Capacitance
In the following table, the capacitance parameters are listed.
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Note
Document Number: 001-51027 Rev. *A
DATA
NV
C
C
Parameter
6. These parameters are guaranteed by design and are not tested.
Parameter
Parameter
IN
OUT
C
Θ
Θ
Output
R
JC
JA
5.0V
Thermal Resis-
tance
(Junction to
Ambient)
Thermal Resis-
tance
(Junction to Case)
Input Capacitance
Output Capacitance
Data Retention
Nonvolatile STORE Operations
Description
Description
30 pF
Description
Test conditions follow
standard test methods and
procedures for measuring
thermal impedance, per EIA /
JESD51.
R1 963Ω
T
V
Test Conditions
A
CC
= 25°C, f = 1 MHz,
= 0 to 3.0 V
Figure 6. AC Test Loads
512Ω
R2
[6]
Test Conditions
28-SOIC
[6]
46.55
27.95
Output
5.0V
(300 mil)
28-PDIP
45.16
31.62
1,000
5 pF
Min
100
(600 mil)
28-PDIP
55.84
25.74
R1 963Ω
28-CDIP
46.1
5.01
For Tri-state Specs
Max
8
7
512Ω
28-LCC
STK12C68
R2
95.31
9.01
Page 9 of 21
Years
Unit
K
Unit
pF
pF
°C/W
°C/W
Unit
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