SST89E58RD2-40-C-TQJE Microchip Technology, SST89E58RD2-40-C-TQJE Datasheet - Page 67
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SST89E58RD2-40-C-TQJE
Manufacturer Part Number
SST89E58RD2-40-C-TQJE
Description
4.5 To 5.5V FlashFlex 8-bit 8051 Microcontroller 44 TQFP 10x10x1mm TRAY
Manufacturer
Microchip Technology
Series
FlashFlex®r
Specifications of SST89E58RD2-40-C-TQJE
Core Processor
8051
Core Size
8-Bit
Speed
40MHz
Connectivity
EBI/EMI, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, WDT
Number Of I /o
36
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Eeprom Size
8K x 8
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Oscillator Type
External
Operating Temperature
0°C ~ 70°C
Package / Case
44-TQFP
Processor Series
FlashFlex51
Core
C51
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
SPI
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
5
Number Of Timers
3
Operating Supply Voltage
4.5 V to 5.5 V
Maximum Operating Temperature
+ 70 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
0 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Data Converters
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
SST89E58RD2-40-C-TQJE
Manufacturer:
Microchip Technology
Quantity:
10 000
Part Number:
SST89E58RD2-40-C-TQJE
Manufacturer:
SST
Quantity:
20 000
FlashFlex MCU
SST89E54RD2A/RDA / SST89E58RD2A/RDA
TABLE 14-2: Reliability Characteristics
TABLE 14-3: AC Conditions of Test
TABLE 14-4: Recommended System Power-up Timings
TABLE 14-5: Pin Impedance (VDD=3.3V, TA=25 °C, f=1 Mhz, other pins open)
©2008 Silicon Storage Technology, Inc.
Symbol
N
T
I
Input Rise/Fall Time . . . . . . . . . . . . . . . 10 ns
Output Load . . . . . . . . . . . . . . . . . . . . . C
See Figures 14-7 and 14-9
Symbol
T
T
Parameter
C
C
L
LTH
DR
PU-READ
PU-WRITE
PIN
END
I/O
IN
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
2. Refer to PCI spec.
1
1
1
1
2
1
1
1
Parameter
Power-up to Read Operation
Power-up to Write Operation
Description
I/O Pin Capacitance
Input Capacitance
Pin Inductance
Parameter
Endurance
Data Retention
Latch Up
L
= 100 pF
T14-3.0 1339
Minimum Specification
67
100 + I
10,000
100
DD
Test Condition
Cycles
Units
Years
mA
Minimum
V
V
I/O
IN
100
100
= 0V
= 0V
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
S71339-02-000
Maximum
20 nH
15 pF
12 pF
Units
Data Sheet
µs
µs
T14-2.0 1339
T14-4.0 1339
T14-5.0 1339
02/08