ACMD-7402-BLK Avago Technologies US Inc., ACMD-7402-BLK Datasheet - Page 3

• Manufacturer Part Number: ACMD-7402-BLK
• Description: RF Transceiver FBAR Duplexer
• Manufacturer: Avago Technologies US Inc.
• Series: -r

Specifications of ACMD-7402-BLK

• Frequency Bands (low / High): 1.85GHz ~ 1.9GHz / 1.93GHz ~ 1.99GHz
• Low Band Attenuation (min / Max Db): 52.00dB / -
• High Band Attenuation (min / Max Db): 43.00dB / -
• Return Loss (low Band / High Band): 20dB / 17dB
• Mounting Type: Surface Mount
• Package / Case: 3-CSP
• Pin Count: 3
• Screening Level: Commercial
• Package Type: CSP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Absolute Maximum Ratings
Parameter
Storage Temperature
Maximum RF Input Power
to Tx Ports
Maximum Recommended Operating Conditions
Parameter
Operating Temperature, Tc
Tx Power 29 dBm
Operating temperature, Tc
Tx Power 30 dBm
Notes:
1. Operation in excess of any one of these conditions may result in
2. The device will function over the recommended range without
3. T
Characterization
A test circuit similar to that shown in Figure 1 was used
to measure typical device performance. This circuit is
designed to interface with Air Coplanar (ACP), Ground-
Signal-Ground (GSG) RF probes of the type commonly
used to test semiconductor wafers.
The test circuit is a 7 x 7 mm PCB with a well-grounded
pad to which the device under test (DUT) is solder-
mounted.
Short lengths of 50-ohm microstripline connect the DUT
to the ACP probe patterns on the board.
Figure 1. ACP probe test circuit
3
permanent damage to the device.
degradation in reliability or permanent change in performance,
but is not guaranteed to meet electrical specifications.
underside of the Duplexer where it makes contact with the circuit
board.
C
is defined as case temperature, the temperature of the
[3]
[1]
[3]
,
,
Unit
dBm
Unit
C
C
C
–65 to +125
–40 to +100
–40 to +85
Value
Value
+33
[2]
A test circuit with a ACMD-7402 mounted in place is
shown in Figure 2. S-parameters are then measured
using a network analyzer and calibrated ACP probe set
Phase data for s-parameters measured with ACP probe
circuits are adjusted to place the reference plane at the
edge of the Duplexer.
Figure 2. Test circuit with ACMD-7402 duplexer