ATF-511P8-TR1 Avago Technologies US Inc., ATF-511P8-TR1 Datasheet - Page 2

IC PHEMT 2GHZ 4.5V 200MA 8-LPCC

ATF-511P8-TR1

Manufacturer Part Number
ATF-511P8-TR1
Description
IC PHEMT 2GHZ 4.5V 200MA 8-LPCC
Manufacturer
Avago Technologies US Inc.
Datasheet

Specifications of ATF-511P8-TR1

Gain
14.8dB
Transistor Type
pHEMT FET
Frequency
2GHz
Voltage - Rated
7V
Current Rating
1A
Noise Figure
1.4dB
Current - Test
200mA
Voltage - Test
4.5V
Power - Output
30dBm
Package / Case
8-LPCC
Power Dissipation Pd
3W
Rf Transistor Case
LPCC
No. Of Pins
8
Frequency Max
6GHz
Noise Figure Typ
1.4dB
Frequency Min
50MHz
Continuous Drain Current Id
16.4µA
Drain Current Idss Max
200mA
Drain Source Voltage Vds
4.5V
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATF-511P8-TR1
Manufacturer:
AVAGO/安华高
Quantity:
20 000
Part Number:
ATF-511P8-TR1G
Manufacturer:
AVAGO
Quantity:
10 000
2
ATF-511P8 Absolute Maximum Ratings
I
I
P
P
T
T
150
120
Notes:
6. Distribution data sample size is 400 samples taken from 4 different wafers and 3 different lots.
7. Measurements are made on production test board, which represents a trade-off between optimal
Symbol
V
V
V
θ
DS
GS
90
60
30
CH
STG
Figure 4. Gain
LSL = 13.5, Nominal = 14.8, USL = 16.5.
diss
in max.
ch_b
DS
GS
GD
0
Future wafers allocated to this product may have nominal values anywhere between the upper and
lower limits.
OIP3, P1dB and VSWR. Circuit losses have been de-embedded from actual measurements.
13
1000
Figure 1. Typical I-V Curves
(V gs = 0.1 per step).
900
800
700
600
500
400
300
200
100
0
0
-3 Std
14
2
Parameter
Drain–Source Voltage
Gate–Source Voltage
Gate Drain Voltage
Drain Current
Gate Current
Total Power Dissipation
RF Input Power
Channel Temperature
Storage Temperature
Thermal Resistance
GAIN (dB)
15
V
DS
4
(V)
+3 Std
Cpk = 1.4
Stdev = 0.31
[2]
16
[4]
6
[2]
0.7 V
0.6 V
0.5 V
0.8 V
[5]
[2]
[2]
[3]
17
8
[1]
Product Consistency Distribution Charts at 2 GHz, 4.5V, 200 mA
240
200
160
120
Figure 2. OIP3
LSL = 38.5, Nominal = 41.7.
160
120
80
40
Figure 5. PAE
LSL = 52, Nominal = 68.9.
80
40
0
0
35
52
Units
V
V
V
A
mA
W
dBm
°C
°C
°C/W
57
38
62
-3 Std
-3 Std
OIP3 (dBm)
PAE (%)
41
67
Absolute
Maximum
7
-5 to 1
-5 to 1
1
46
3
+30
150
-65 to 150
33
72
+3 Std
Cpk = 1.66
Stdev = 0.6
+3 Std
Cpk = 3.03
Stdev = 1.85
44
77
47
82
Notes:
1. Operation of this device in excess of any one
2. Assumes DC quiescent conditions.
3. Board (package belly) temperatureT
4. With 10 Ohm series resistor in gate supply
5. Channel-to-board thermal resistance
6. Device can safely handle +30dBm RF Input
200
160
120
Figure 3. P1dB
LSL = 28.5, Nominal = 30.
80
40
of these parameters may cause permanent
damage.
Derate 30 mW/°C for T
and 3:1 VSWR.
measured using 150°C Liquid Crystal
Measurement method.
Power provided I
P
0
28
1dB
drive level is bias circuit dependent.
29
P1dB (dBm)
GS
limited to 46mA. I
-3 Std
B
> 50°C.
[6,7]
30
Cpk = 3.24
Stdev = 0.15
+3 Std
B
GS
is 25°C.
at
31

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