ATF-33143-TR2G Avago Technologies US Inc., ATF-33143-TR2G Datasheet - Page 2

IC PHEMT 1.9GHZ 80MA LN SOT-343

ATF-33143-TR2G

Manufacturer Part Number
ATF-33143-TR2G
Description
IC PHEMT 1.9GHZ 80MA LN SOT-343
Manufacturer
Avago Technologies US Inc.
Datasheet

Specifications of ATF-33143-TR2G

Transistor Type
pHEMT FET
Frequency
2GHz
Gain
15dB
Voltage - Rated
5.5V
Current Rating
305mA
Noise Figure
0.5dB
Current - Test
80mA
Voltage - Test
4V
Power - Output
22dBm
Package / Case
SC-70-4, SC-82-4, SOT-323-4, SOT-343
Channel Type
N
Configuration
Single Dual Source
Gate-source Voltage (max)
5V
Operating Temperature Classification
Military
Mounting
Surface Mount
Pin Count
4 +Tab
Package Type
SOT-343
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ATF-33143-TR2G
Manufacturer:
AVAGO/安华高
Quantity:
20 000
ATF-33143 Absolute Maximum Ratings
Product Consistency Distribution Charts
Notes:
7. Under large signal conditions, V
8. Distribution data sample size is 450 samples taken from 9 different wafers. Future wafers allocated to this product may have nominal values
9. Measurements made on production test board. This circuit represents a trade-off between an optimal noise match and a realizeable match based
10. The probability of a parameter being between ±1σ is 68.3%, between ±2σ is 95.4% and between ±3σ is 99.7%.
2
Figure 1. Typical Pulsed I-V Curves
100
500
400
300
200
100
Figure 3. OIP3 @ 2 GHz, 4 V, 80 mA.
LSL=30.0, Nominal=33.3, USL=37.0
P
anywhere within the upper and lower spec limits.
on production test requirements. Circuit losses have been de-embedded from actual measurements.
80
60
40
20
diss
Symbol
0
P
0
29
P
T
in max
V
V
T
V
0
I
θ
and P
STG
DS
diss
GD
DS
GS
CH
jc
-3 Std
in max
31
2
ratings are not exceeded.
OIP3 (dBm)
Drain - Source Voltage
Gate - Source Voltage
Gate Drain Voltage
Drain Current
Total Power Dissipation
RF Input Power
Channel Temperature
Storage Temperature
Thermal Resistance
V
+0.6 V
DS
33
4
(V)
0 V
[7]
Parameter
. (V
35
GS
GS
6
[2]
–0.6 V
= -0.2 V per step)
may swing positive and the drain current may exceed I
+3 Std
37
[2]
[6]
8
[2]
[5]
Cpk = 1.21
Std = 0.94
[2]
[4]
[1]
[8, 9]
°C/W
Units
dBm
mW
mA
°C
°C
V
V
V
120
100
120
100
Figure 2. NF @ 2 GHz, 4 V, 80 mA.
LSL=0.2, Nominal=0.53, USL=0.8
Figure 4. Gain @ 2 GHz, 4 V, 80 mA.
LSL=13.5, Nominal=14.8, USL=16.5
80
60
40
20
80
60
40
20
0
0
0.2
13
-65 to 160
0.3
Maximum
Absolute
-3 Std
I
14
dss
600
160
145
-3 Std
5.5
20
-5
-5
[3]
0.4
GAIN (dB)
dss
NF (dB)
. These conditions are acceptable as long as the maximum
0.5
15
+3 Std
0.6
Notes:
1. Operation of this device above any one of
2. Assumes DC quiesent conditions.
3. V
4. Source lead temperature is 25°C. Derate
5. Please refer to failure rates in reliability
6. Thermal resistance measured using 150°C
16
+3 Std
these parameters may cause permanent
damage.
6 mW/°C for T
section to assess the reliability impact
of running devices above a channel
temperature of 140°C.
Liquid Crystal Measurement method.
0.7
GS
= 0 V
0.8
17
Cpk = 1.7
Std = 0.05
Cpk = 2.3
Std = 0.2
L
> 60°C.

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