CUS02(TE85L,Q) Toshiba, CUS02(TE85L,Q) Datasheet
CUS02(TE85L,Q)
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CUS02(TE85L,Q) Summary of contents
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... Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). ...
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Marking Abbreviation Code Part No. 2 CUS02 Standard Soldering Pad 2.0 1.1 Handling Precaution Schottky barrier diodes have reverse current characteristics compared to other diodes. There is a possibility SBD may cause thermal runaway when it is used under high ...
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150°C 1 75°C 100°C 25°C 0.1 0.01 0.0 0.2 0.4 0.6 0.8 Instantaneous forward voltage max – (AV) 160 Device mounted on a ceramic board (board ...
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Surge forward current (non-repetitive Number of cycles I – 100 Pulse test 0 ...
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... TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property ...