BAW56LT1G ON Semiconductor, BAW56LT1G Datasheet - Page 2

• Manufacturer Part Number: BAW56LT1G
• Description: DIODE SWITCH DUAL CA 70V SOT23
• Manufacturer: ON Semiconductor

Specifications of BAW56LT1G

• Voltage - Forward (vf) (max) @ If: 1.25V @ 150mA
• Current - Reverse Leakage @ Vr: 2.5µA @ 70V
• Current - Average Rectified (io) (per Diode): 200mA (DC)
• Voltage - Dc Reverse (vr) (max): 70V
• Reverse Recovery Time (trr): 6ns
• Diode Type: Standard
• Speed: Small Signal =< 200mA (Io), Any Speed
• Diode Configuration: 1 Pair Common Anode
• Mounting Type: Surface Mount
• Package / Case: SOT-23-3, TO-236-3, Micro3™, SSD3, SST3
• Product: Switching Diodes
• Peak Reverse Voltage: 70 V
• Forward Continuous Current: 0.2 A
• Max Surge Current: 4 A
• Configuration: Dual Common Anode
• Recovery Time: 6 ns
• Forward Voltage Drop: 1.25 V
• Maximum Reverse Leakage Current: 2.4 uA
• Operating Temperature Range: - 55 C to + 150 C
• Maximum Operating Temperature: + 150 C
• Minimum Operating Temperature: - 55 C
• Mounting Style: SMD/SMT
• Rectifier Type: Small Signal Switching Diode
• Peak Rep Rev Volt: 70V
• Avg. Forward Curr (max): 0.2A
• Rev Curr: 2.5uA
• Peak Non-repetitive Surge Current (max): 4A
• Forward Voltage: 1.25V
• Operating Temp Range: -55C to 150C
• Package Type: SOT-23
• Rev Recov Time: 6ns
• Operating Temperature Classification: Military
• Mounting: Surface Mount
• Pin Count: 3
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: BAW56LT1GOSTR

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Initial Product/Process Change Notification #16009
QUALIFICATION PLAN:
Qualification of each device type to be transferred is being performed to the following
requirements:
Reliability testing will be performed on qualification vehicles chosen based on die size,
voltage rating, and run rates.
Planned reliability tests are:
Electrical Characterization Plan:
Datasheet specifications and product electrical performance will remain unchanged
Characterization of each qual vehicle device will be performed to the following requirements:
Issue Date: 08 May 2007
HTSL
AC-PC
TC -PC Temperature Cycle-PC
H3TRB
– PC
IOL-PC IOL-PC
1) Three temperature electrical characterization ( 3 lots, 30 units each at -55C, 25C, and
2) ESD testing (3 lots) Human Body Model, Machine Model
1) ESD performance ( HBM, MM) on 15 units from 1 lot
2) Three temperature characterization on 30 units from 3 lots
Test
150C)
High Temp Storage Life Ta=150°
Autoclave-PC
High
Temp Rev Bias + PC
Humidity
Name
High
121°C/100% RH/15psig
Ta=-65/+150deg.C, Air to
air, Dwell = 10 min,
Ta=85°C, 85% RH, 80%
rated or 100V max
Ta=+25°C, delta Tj=100°C
On/of = 2 min
Rev.07-02-06
Test Conditions
c = 0, Room
c = 0, Room
c = 0, Room
c = 0, Room
c = 0, Room
End Point
Req’s
Test Results
Read Point
15000 Cys.
1008 Hrs.
1008 Hrs.
1000 Cys
96 Hrs
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