TGA8334-SCC TriQuint, TGA8334-SCC Datasheet - Page 11

• Manufacturer Part Number: TGA8334-SCC
• Description: Wireless Accessories 2.0-20GHz Power Amp AGC
• Manufacturer: TriQuint

Specifications of TGA8334-SCC

• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 1004281

Product Data Sheet
April 25, 2003
Product Application Note
s
Recommended Maximum Input Power for TGA8334-SCC MMIC
Background: TriQuint Semiconductor Texas has conducted tests to determine
the maximum input power that can be applied to MESFET MMICs. In many
applications, devices may be subjected to higher input powers than the
recommended normal operating conditions. It is understood that applications at
greater than recommended input power may lead to degradation of device
performance.
Method: Tests were performed on samples of the TGA8334 to determine a safe
operating level of input power.
An acceptable operating condition for input power is defined as a change
of <10% in Id or a change of <1dB in gain
Tests were performed for 24 hours each. Both RF device characteristics were
measured before and after the devices were subjected to high input power
conditions. An input power that degraded any of the above parameters in excess
of the stated allowable changes in performance was considered to be an
unacceptable condition. Figure 1 below illustrates the test sequence.
Device Characteristics
Device Subjected
Device Characteristics
Measured
to Pin = 27dBm for
Measured
(Before Measurement)
24 hours
(After Measurement)
Figure 1 -- Device Test Flow Diagram
Results: Table 1 summarizes the DC and RF performance of the TGA8334
samples after being subjected to an input power of 27dBm for 24 hrs. All
parameters remained within the acceptable degradation range. The maximum
input power value that is listed on each TriQuint data sheet, reflects the
acceptable input power level that may be applied without degradation in excess
of that listed above.
It should be noted that device MTTF may be affected by long term exposure
to high input power levels. Devices operated at or near maximum value for
long periods of time may experience degraded performance or failure.
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