EM-LPC1700-58 EMBEST, EM-LPC1700-58 Datasheet - Page 12

• Manufacturer Part Number: EM-LPC1700-58
• Description: NXP LPC1758 Evaluation Board
• Manufacturer: EMBEST

Specifications of EM-LPC1700-58

• Silicon Manufacturer: NXP
• Core Architecture: ARM
• Core Sub-architecture: Cortex-M3
• Features: Cortex Debug, Mini SD Card, USB Device/Host/OTG Interface
• Silicon Core Number: LPC17xx
• Silicon Family Name: LPC17xx

Steps: Download rtc.hex to the FLASH of MCU
Testing phenomenon: Examine the corresponding changes which the RTC related
register bring about
Image file: DAC_Test.hex
Corresponding chip manual: Datasheet\[processor].pdf
Steps: Download DAC_Test.hex to the FLASH of MCU
Testing phenomenon: The buzzer in LCD emits sound signals
Image file: CAN.hex
Location of source code: CAN
Corresponding chip manual: Documents\Datasheet\Peripherals corresponding\
lpc17xx.can.arm.pdf
Steps: Link CAN1 and CAN2 through direct serial cable, and download CAN.hex to the
FLASH of MCU
Testing phenomenon: The color LCD displays the AD conversed value of CAN receive
Image file: SD_test.hex
Location of source code: SD_test
Corresponding chip manual: Datasheet\[processor].pdf
Steps: According to (3) UART Testing configures hype terminal, link com1 to PC, plug in
SD card, and download SD_test.hex to the FLASH of MCU
Testing phenomenon: Hype terminal displays the related information of SD card
Image file: HTTPDEMO.hex
Corresponding chip manual: Datasheet\[processor].pdf
Steps:
1) Download HTTPDEMO.hex to the FLASH of MCU
2) The evaluation board IP: 192.168.0.100
3) PC’s configuration as follows:
IP: 192.168.0.101
Subnet Mask: 255.255.255.0
Default Gateway: 192.168.0.254
Testing phenomenon: Input 192.168.0.100 in the IE address bar, click on AD and
(5) DAC SPK Testing
(6) CAN&ADC Testing
(7) SD card Testing
Location of source code: DAC
(8) Network Testing (RL-ARM holder)
Location of source code: HTTPDEMO
www.embedinfo.com/en
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