87782-2001 Molex Inc, 87782-2001 Datasheet - Page 4

CONN SOCKET MINIDIMM VERT SMD

87782-2001

Manufacturer Part Number
87782-2001
Description
CONN SOCKET MINIDIMM VERT SMD
Manufacturer
Molex Inc
Series
87782r
Datasheets

Specifications of 87782-2001

Connector Style
MiniDIMM
Number Of Positions
244
Memory Type
DDR 2 SDRAM
Standards
MO-244
Mounting Type
Surface Mount
Features
Board Guide, Latches
Contact Finish
Gold
Contact Finish Thickness
30µin (0.76µm)
Connector Type
DIMM Socket
No. Of Contacts
244
Pitch Spacing
0.6mm
Contact Material
Copper
Contact Plating
Gold
Contact Termination
Surface Mount Vertical
Current Rating
0.5A
Pitch
0.6 mm
Number Of Positions / Contacts
244
Mounting Style
SMD/SMT
Mounting Angle
Vertical
Housing Material
Thermoplastic, High Temperature
Voltage Rating
30 V
Body Material
LCP
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Mounting Feature
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
087782-2001
087782-2001-E
0877822001
0877822001-E
87782-2001-E
877822001
877822001-E
WM23938

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
87782-2001
Manufacturer:
MOLEX
Quantity:
34 769
REVISION: ECR/ECN INFORMATION:
DOCUMENT NUMBER:
B1
5.3 ENVIRONMENTAL REQUIREMENTS
ITEM
5.3.1
5.3.2
5.3.3
5.3.4
5.3.5
5.3.6
5.3.7
PS-87782-027
EC No:
DATE:
Reflow Process
Temperature &
Thermal Aging
DESCRIPTION
Solderability
Resistance
Withstand
(Thermal)
Humidity
Porosity
Solvent
Shock
Cyclic
S2008-0204
2007/09/12
PRODUCT SPECIFICATION
Mated, +105±2°C for 500 hours per EIA 364 –
17. Preconditioning to be done at 105°C for 72
hrs
MIL – STD- 202F Method 215J
Solder time: 5±0.5 seconds.
Solder temperature: 245±5°C
Subject to steam aging for 8 hours ± 5 mins.
(For Tin-Lead Version)
Solder time: 5±0.5 seconds.
Solder temperature: 260±5°C
Subject to steam aging for 8 hours ± 5 mins.
(For Tin Version)
EIA 364, TP-53 Nitric Acid Test, 10 contacts
per contact type selected at random
Unmated, exposed to reflow profile as defined
in Section 8.1.
TEST CONDITION
Mate connectors; expose to 5 cycles of:
Temperature °C
EIA-364-32-Test condition l
Mated connectors exposed for 10 days at
25°C to 65°C at 90-98% RH, per EIA 364-31
Method 3.
+25 +10/-5
+85 +3/-0
+25 +10/-5
-55 +0/-3
TITLE:
CREATED / REVISED BY:
ATSEE 2007/09/12
VERTICAL MINI DIMM CONNECTOR
200/244 CKT, 0.60MM PITCH
30
30
Duration (Minutes)
5 MAXIMUM
5 MAXIMUM
SKANG 2007/09/20
CHECKED BY:
TEMPLATE FILENAME: PRODUCT_SPEC[SIZE_A4](V.1).DOC
No change in LLCR greater
than 10 mΩ from initial.
No change in LLCR greater
than 10 mΩ from initial.
No change in LLCR greater
than 10 mΩ from initial.
95% solder coverage
minimum.
Max. number of pores :
30uin-1 pore per 10 contacts
No damage or degradation
of any marking.
No damage or blistering.
REQUIREMENT
MLONG 2007/09/20
APPROVED BY:
SHEET No.
4
of
6

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