PIC18F4580-E/PT Microchip Technology, PIC18F4580-E/PT Datasheet - Page 362

IC,MICROCONTROLLER,8-BIT,PIC CPU,CMOS,TQFP,44PIN,PLASTIC

PIC18F4580-E/PT

Manufacturer Part Number
PIC18F4580-E/PT
Description
IC,MICROCONTROLLER,8-BIT,PIC CPU,CMOS,TQFP,44PIN,PLASTIC
Manufacturer
Microchip Technology
Series
PIC® 18Fr

Specifications of PIC18F4580-E/PT

Rohs Compliant
YES
Core Processor
PIC
Core Size
8-Bit
Speed
25MHz
Connectivity
CAN, I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, HLVD, POR, PWM, WDT
Number Of I /o
36
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Eeprom Size
256 x 8
Ram Size
1.5K x 8
Voltage - Supply (vcc/vdd)
4.2 V ~ 5.5 V
Data Converters
A/D 11x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
44-TQFP, 44-VQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Quantity
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Part Number:
PIC18F4580-E/PT
Manufacturer:
Microchip Technology
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PIC18F2480/2580/4480/4580
FIGURE 25-4:
25.4.3
By entering a power-managed mode, the clock
multiplexer selects the clock source selected by the
OSCCON register. Fail-Safe Clock Monitoring of
the power-managed clock source resumes in the
power-managed mode.
If an oscillator failure occurs during power-managed
operation, the subsequent events depend on whether
or not the oscillator failure interrupt is enabled. If
enabled (OSCFIF = 1), code execution will be clocked
by the INTOSC multiplexer. An automatic transition
back to the failed clock source will not occur.
If the interrupt is disabled, subsequent interrupts while
in Idle mode will cause the CPU to begin executing
instructions while being clocked by the INTOSC
source.
25.4.4
The FSCM is designed to detect oscillator failure at any
point after the device has exited Power-on Reset
(POR) or low-power Sleep mode. When the primary
device clock is EC, RC or INTRC modes, monitoring
can begin immediately following these events.
DS39637D-page 362
Note:
Sample Clock
CM Output
FSCM INTERRUPTS IN
POWER-MANAGED MODES
POR OR WAKE-UP FROM SLEEP
OSCFIF
Device
Output
Clock
The device clock is normally at a much higher frequency than the sample clock. The relative frequencies in this
example have been chosen for clarity.
(Q)
FSCM TIMING DIAGRAM
CM Test
For oscillator modes involving a crystal or resonator
(HS, HSPLL, LP or XT), the situation is somewhat
different. Since the oscillator may require a start-up
time considerably longer than the FCSM sample clock
time, a false clock failure may be detected. To prevent
this, the internal oscillator block is automatically
configured as the device clock and functions until the
primary clock is stable (the OST and PLL timers have
timed out). This is identical to Two-Speed Start-up
mode. Once the primary clock is stable, the INTRC
returns to its role as the FSCM source.
As noted in Section 25.3.1 “Special Considerations
for Using Two-Speed Start-up”, it is also possible to
select another clock configuration and enter an alternate
power-managed mode while waiting for the primary
clock to become stable. When the new power-managed
mode is selected, the primary clock is disabled.
Note:
CM Test
Oscillator
Failure
The same logic that prevents false oscilla-
tor failure interrupts on POR, or wake from
Sleep, will also prevent the detection of
the oscillator’s failure to start at all follow-
ing these events. This can be avoided by
monitoring the OSTS bit and using a
timing routine to determine if the oscillator
is taking too long to start. Even so, no
oscillator failure interrupt will be flagged.
© 2009 Microchip Technology Inc.
Detected
Failure
CM Test

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