SST49LF016C-33-4C-WHE SILICON STORAGE TECHNOLOGY, SST49LF016C-33-4C-WHE Datasheet - Page 29

MEMORY, FLASH, 16M, SERIAL, 32TSOP

SST49LF016C-33-4C-WHE

Manufacturer Part Number
SST49LF016C-33-4C-WHE
Description
MEMORY, FLASH, 16M, SERIAL, 32TSOP
Manufacturer
SILICON STORAGE TECHNOLOGY
Datasheet

Specifications of SST49LF016C-33-4C-WHE

Memory Size
16Mbit
Clock Frequency
33MHz
Supply Voltage Range
3V To 3.6V
Memory Case Style
TSOP
No. Of Pins
32
Operating Temperature Range
0°C To +70°C
Svhc
No SVHC (18-Jun-2010)
Memory Type
Flash
Memory Configuration
2M X 8
Interface Type
Serial
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SST49LF016C-33-4C-WHE
Manufacturer:
Microchip Technology
Quantity:
135
16 Mbit LPC Serial Flash
SST49LF016C
TABLE 28: Interface Measurement Condition Parameters (LPC Mode)
©2008 Silicon Storage Technology, Inc.
Symbol
V
V
V
V
Input Signal Edge Rate
TH
TL
TEST
MAX
FIGURE 12: Output Timing parameters (LPC Mode)
FIGURE 13: Input Timing Parameters (LPC Mode)
1. The input test environment is done with 0.1 V
1
1
drive than this. V
different voltage values, but must correlate results back to these parameters.
1
(Valid Input Data)
MAX
LAD [3:0]
specifies the maximum peak-to-peak waveform allowed for measuring input timing. Production testing may use
LCLK
(Valid Output Data)
(Float Output Data)
LAD [3:0]
LAD [3:0]
LCLK
DD
of overdrive over V
T
V
ON
TEST
T
29
VAL
T
Inputs
Valid
SU
T
IH
OFF
and V
0.6 V
0.2 V
0.4 V
0.4 V
Value
1
IL
DD
DD
DD
DD
. Timing parameters must be met with no more over-
V
TEST
T
DH
1237 F11.0
V
V
V
TH
TL
MAX
1237 F12.0
V
V
Units
TH
TL
V/ns
S71237-08-000
V
V
V
V
Data Sheet
T28.0 1237
5/08

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