ML610Q435A-NNNTC03A7 Rohm Semiconductor, ML610Q435A-NNNTC03A7 Datasheet - Page 14

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ML610Q435A-NNNTC03A7

Manufacturer Part Number
ML610Q435A-NNNTC03A7
Description
MCU 8BIT 96K FLASH 144-LQFP
Manufacturer
Rohm Semiconductor

Specifications of ML610Q435A-NNNTC03A7

Core Processor
nX-U8/100
Core Size
8-Bit
Speed
4.2MHz
Connectivity
I²C, SSP, UART/USART
Peripherals
LCD, Melody Driver, POR, PWM, WDT
Number Of I /o
22
Program Memory Size
96KB (48K x 16)
Program Memory Type
FLASH
Ram Size
3K x 8
Voltage - Supply (vcc/vdd)
1.1 V ~ 3.6 V
Data Converters
A/D 2x12b, 2x24b
Oscillator Type
Internal
Operating Temperature
-20°C ~ 70°C
Package / Case
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
ML610Q435A-NNNTC03A7
Manufacturer:
Rohm Semiconductor
Quantity:
10 000
Chapter 28
Chapter 29
Chapter 30
Appendixes
Revision History
28. Battery Level Detector.................................................................................................................................. 28-1
29. Power Supply Circuit.................................................................................................................................... 29-1
30. On-Chip Debug Function.............................................................................................................................. 30-1
Appendix A Registers......................................................................................................................................... A-1
Appendix B Package Dimensions........................................................................................................................B-1
Appendix C Electrical Characteristics .................................................................................................................C-1
Appendix D Application Circuit Example.......................................................................................................... D-1
Appendix E Check List........................................................................................................................................E-1
Revision History .....................................................................................................................................................R-1
27.3 Description of Operation......................................................................................................................... 27-35
28.1 Overview................................................................................................................................................... 28-1
28.2 Description of Registers............................................................................................................................ 28-2
28.3 Description of Operation........................................................................................................................... 28-5
29.1 Overview................................................................................................................................................... 29-1
29.2 Description of Operation........................................................................................................................... 29-2
30.1 Overview................................................................................................................................................... 30-1
30.2 Method of Connecting to On-Chip Debug Emulator ................................................................................ 30-1
30.3 Flash Memory Rewrite Function .............................................................................................................. 30-2
27.3.1
27.3.2
27.3.3
27.3.4
27.3.5
28.1.1
28.1.2
28.2.1
28.2.2
28.2.3
28.3.1
28.3.2
29.1.1
29.1.2
29.1.3
Operation of LCD Drivers and Bias Generation Circuit................................................................. 27-35
Segment Mapping When the Programmable Display Allocation Function is Not Used ................ 27-36
Segment Mapping When the Programmable Display Allocation Function is Used ....................... 27-37
Common Output Waveforms .......................................................................................................... 27-39
Segment Output Waveform ............................................................................................................ 27-41
Features............................................................................................................................................. 28-1
Configuration .................................................................................................................................... 28-1
List of Registers ................................................................................................................................ 28-2
Battery Level Detector Control Register 0 (BLDCON0).................................................................. 28-3
Battery Level Detector Control Register 1 (BLDCON1).................................................................. 28-4
Threshold Voltage............................................................................................................................. 28-5
Operation of Battery Level Detector................................................................................................. 28-6
Features............................................................................................................................................. 29-1
Configuration .................................................................................................................................... 29-1
List of Pins........................................................................................................................................ 29-1
Contents – 10
ML610Q435/ML610Q436 User’s Manual
Contents

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