WM8741GEDS/V Wolfson Microelectronics, WM8741GEDS/V Datasheet - Page 9

Audio D/A Converter ICs Stereo DAC, High End

WM8741GEDS/V

Manufacturer Part Number
WM8741GEDS/V
Description
Audio D/A Converter ICs Stereo DAC, High End
Manufacturer
Wolfson Microelectronics
Datasheet

Specifications of WM8741GEDS/V

Mounting Style
SMD/SMT
Package / Case
SSOP-28
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
WM8741GEDS/V
Manufacturer:
Wolfson Microelectronics
Quantity:
1 881
Production Data
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating
at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
Wolfson Microelectronics tests its package types according to IPC/JEDEC J-STD-020B for Moisture Sensitivity to determine
acceptable storage conditions prior to surface mount assembly. These levels are:
MSL1 = unlimited floor life at <30°C / 85% Relative Humidity. Not normally stored in moisture barrier bag.
MSL2 = out of bag storage for 1 year at <30°C / 60% Relative Humidity. Supplied in moisture barrier bag.
MSL3 = out of bag storage for 168 hours at <30°C / 60% Relative Humidity. Supplied in moisture barrier bag.
The Moisture Sensitivity Level for each package type is specified in Ordering Information.
Notes:
THERMAL PERFORMANCE
w
CONDITION
Digital supply voltage, DVDD
Analogue supply voltage, AVDD
Voltage range digital inputs
Voltage range analogue inputs
Master Clock Frequency
Operating temperature range, T
Storage temperature
Ambient temperature (supplies applied)
Pb free package body temperature (soldering 10 seconds)
Pb free package body temperature (soldering 2 minutes)
Thermal resistance –
junction to case
Thermal resistance –
junction to ambient
1. Analogue and digital grounds must always be within 0.3V of each other.
PARAMETER
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically
susceptible to damage from excessive static voltages. Proper ESD precautions must be taken during handling
and storage of this device.
A
SYMBOL
θ
θ
JC
JA
TEST CONDITIONS
DGND - 0.3V
AGND - 0.3V
MIN
-40°C
-65°C
-55°C
-0.3V
-0.3V
MIN
23.9
67.1
TYP
PD, Rev 4.2, October 2009
MAX
DVDD + 0.3V
AVDD + 0.3V
38.462MHz
+150°C
+125°C
+260°C
+183°C
+85°C
+4.5V
MAX
+7V
WM8741
°C/W
°C/W
UNIT
9

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