PN5310A3HN/C203,51 NXP Semiconductors, PN5310A3HN/C203,51 Datasheet - Page 9

• Manufacturer Part Number: PN5310A3HN/C203,51
• Description: IC TRANSMISSION MOD 40-HVQFN
• Manufacturer: NXP Semiconductors

Specifications of PN5310A3HN/C203,51

• Rf Type: Read / Write
• Frequency: 13.56MHz
• Features: ISO14443A / Mifare
• Package / Case: 40-VQFN Exposed Pad, 40-HVQFN, 40-SQFN, 40-DHVQFN
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 935280844518; PN5310A3HN/C203-T; PN5310A3HN/C203-T

Philips Semiconductors
PN531
Pin
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
P33_INT1
P32_INT0
RSTOUT
DELATT
Symbol
RSTPD
SVDD
PVDD
DVDD
VBUS
MOSI
MISO
NSS
SCK
P31
P30
IRQ
Type
PWR
PWR
PWR
PWR
IO
IO
IO
IO
IO
IO
IO
IO
IO
O
O
I
Pad Ref
Voltage
PVDD
PVDD
PVDD
PVDD
PVDD
PVDD
PVDD
PVDD
PVDD
PVDD
PVDD
PVDD
Description
this signal is used as test signal input.
Connected to SAM power supply; used as a reference for communication
with the SAM.
General purpose IO signal. Can be configured to act either as TX line of
the second serial interface or general purpose IO. In test mode this signal
is used as input and output test signal.
General purpose IO signal. Can be configured to act either as RX line of
the second serial interface or general purpose IO. In test mode this signal
is used as input and output test signal.
Interrupt request: Output to signal an interrupt event to the host (Port 7 bit
0)
Output reset signal. When Low it indicates that the circuit is in reset state.
Optional output for an external 1.5 KOhms resistor connection on D+.
Not Slave Select. In test mode this signal is used as input and output test
signal.
Master Out Slave In. In test mode this signal is used as input and output
test signal
Master In Slave Out. In test mode this signal is used as input and output
test signal
Serial interface clock. In test mode this signal is used as input and output
test signal
Pad power supply
General purpose IO signal. Can be used to generate an HZ state on the
output of the selected interface for the Host communication and to enter
TAMA into power down mode without resetting the internal state of TAMA.
In test mode this signal is used as input and output test signal.
General purpose IO signal. Can also be used as an interrupt source In test
mode this signal is used as input and output test signal.
Reset and Power Down: When High, internal current sources are switched
off, the oscillator is inhibited, and the input pads are disconnected from the
outside world. With a positive edge on this pin the internal reset phase
starts.
Digital Power Supply
USB power supply.
Objective Short Form Specification Rev. 2.0 February 2004
9
µC based Transmission module