AT89C5131A-TISIL Atmel, AT89C5131A-TISIL Datasheet - Page 159

• Manufacturer Part Number: AT89C5131A-TISIL
• Description: IC 8051 MCU FLASH 32K USB 28SOIC
• Manufacturer: Atmel
• Series: AT89C513xr

Specifications of AT89C5131A-TISIL

• Core Processor: C52X2
• Core Size: 8-Bit
• Speed: 48MHz
• Connectivity: I²C, SPI, UART/USART, USB
• Peripherals: LED, POR, PWM, WDT
• Number Of I /o: 18
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 4K x 8
• Ram Size: 1.25K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 28-SOIC (7.5mm Width)
• For Use With: AT89STK-10 - KIT EVAL APPL MASS STORAGEAT89STK-05 - KIT STARTER FOR AT89C5131
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Data Converters: -

Electrical Characteristics
Absolute Maximum Ratings
DC Parameters
T
4338F–USB–08/07
A
Ambient Temperature Under Bias:
I = industrial ........................................................-40°C to 85°C
Storage Temperature .................................... -65°C to + 150°C
Voltage on V
Voltage on Any Pin from V
Symbol
= -40°C to +85°C; V
V
V
R
V
V
V
V
C
V
V
I
I
PFDP
I
OH1
I
I
OL1
RST
PD
CC
TL
IH1
OH
IL
LI
OL
IH
IO
IL
Parameter
Input Low Voltage
Input High Voltage except XTAL1, RST
Input High Voltage, XTAL1, RST
Output Low Voltage, ports 1, 2, 3 and 4
Output Low Voltage, port 0, ALE, PSEN
Output High Voltage, ports 1, 2, 3, 4 and 5
Output High Voltage, port 0, ALE, PSEN
RST Pullup Resistor
Logical 0 Input Current ports 1, 2, 3 and 4
Input Leakage Current
Logical 1 to 0 Transition Current, ports 1, 2, 3
and 4
Capacitance of I/O Buffer
Power-down Current
Power Supply Current
Power Fail High Level Threshold
CC
from V
SS
SS
......................................-0.5V to + 6V
SS
= 0V; V
.....................-0.5V to V
CC
= 3.3V ± 10%; F = 0 to 40 MHz
(6)
(6)
CC
+ 0.2V
0.2 V
V
V
V
V
V
V
0.7 V
CC
CC
CC
CC
CC
CC
Min
-0.5
CC
50
- 0.3
- 0.7
- 1.5
- 0.3
- 0.7
- 1.5
CC
+ 0.9
I
I
CCwrite
I
CCIDLE
CCOP
Note:
= 0.4xF(MHz)+5
= 0.8xF(MHz)+15
= 0.3xF(MHz)+5
Typ
100
Stresses at or above those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only and functional
operation of the device at these or any other condi-
tions above those indicated in the operational
sections of this specification is not implied. Exposure
to absolute maximum rating conditions may affect
device reliability.
(5)
0.2Vcc - 0.1
V
V
CC
CC
Max
-650
0.45
0.45
200
100
±10
0.3
1.0
0.3
1.0
-50
3.0
10
+ 0.5
+ 0.5
Unit
kΩ
µA
µA
µA
pF
µA
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
Test Conditions
I
I
I
I
I
I
I
I
I
V
I
I
I
V
Vin = 0.45V
0.45V < Vin < V
Vin = 2.0V
Fc = 1 MHz
T
3.0V < V
V
OL
OL
OL
OL
OL
OL
OH
OH
OH
OH
OH
OH
A
CC
CC
CC
= 25°C
= 100 µA
= 0.8 mA
= 1.6mA
= 200 µA
= 1.6 mA
= 3.5 mA
= -10 µA
= -30 µA
= -60 µA
= -200 µA
= -1.6 mA
= -3.5 mA
= 3.3V ± 10%
= 3.3V ± 10%
= 3.3V
CC
< 3.6V
(1)(2)
(4)
(4)
(4)
(4)
(4)
(4)
CC
(3)
159