C8051F504-IQ Silicon Laboratories Inc, C8051F504-IQ Datasheet - Page 40

• Manufacturer Part Number: C8051F504-IQ
• Description: IC 8051 MCU 32K FLASH 48-QFP
• Manufacturer: Silicon Laboratories Inc
• Series: C8051F50xr

Specifications of C8051F504-IQ

• Program Memory Type: FLASH
• Program Memory Size: 32KB (32K x 8)
• Package / Case: 48-QFP
• Mfg Application Notes: LIN Bootloader AppNote
• Core Processor: 8051
• Core Size: 8-Bit
• Speed: 50MHz
• Connectivity: EBI/EMI, SMBus (2-Wire/I²C), CAN, LIN, SPI, UART/USART
• Peripherals: POR, PWM, Temp Sensor, WDT
• Number Of I /o: 40
• Ram Size: 4.25K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 5.25 V
• Data Converters: A/D 32x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Processor Series: C8051F5x
• Core: 8051
• Data Bus Width: 8 bit
• Data Ram Size: 4.25 KB
• Interface Type: I2C/SPI/UART
• Maximum Clock Frequency: 50 MHz
• Number Of Programmable I/os: 40
• Number Of Timers: 4
• Maximum Operating Temperature: + 125 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: PK51, CA51, A51, ULINK2
• Development Tools By Supplier: C8051F500DK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 32-ch x 12-bit
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: 336-1527 - KIT DEV FOR C8051F50X
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 336-1518

C8051F50x/F51x
5. Electrical Characteristics
5.1. Absolute Maximum Specifications
Table 5.1. Absolute Maximum Ratings
40
Ambient Temperature under Bias
Storage Temperature
Voltage on V
Voltage on V
Voltage on VDDA with Respect to GND
Voltage on V
Voltage on any Port I/O Pin or RST with Respect to
GND
Maximum Total Current through V
Maximum Output Current Sunk by RST or any Port Pin
Maximum Output Current Sourced by any Port Pin
Note: Stresses
device. This is a stress rating only and functional operation of the devices at those or any other conditions
above those indicated in the operation listings of this specification is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability.
REGIN
DD
IO
outside of the range of the
with Respect to GND
with Respect to GND
with Respect to GND
Parameter
REGIN
or GND
“Absolute Maximum Ratings” may cause permanent damage to the
Rev. 1.2
Conditions
–0.3
–0.3
–0.3
–0.3
–0.3
Min
–55
–65
—
—
—
Typ
—
—
—
—
—
—
—
—
—
—
V
IO
Max
135
150
500
100
100
5.5
2.8
2.8
5.5
+ 0.3
Units
mA
mA
mA
°C
°C
V
V
V
V
V