MC9S08GT32ACFDER Freescale Semiconductor, MC9S08GT32ACFDER Datasheet - Page 275
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MC9S08GT32ACFDER
Manufacturer Part Number
MC9S08GT32ACFDER
Description
MCU 8BIT 32K FLASH 48-QFN
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet
1.MC9S08GT60ACFDER.pdf
(302 pages)
Specifications of MC9S08GT32ACFDER
Core Processor
HCS08
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
39
Program Memory Size
32KB (32K x 8)
Program Memory Type
FLASH
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-QFN Exposed Pad
Processor Series
S08GT
Core
HCS08
3rd Party Development Tools
EWS08
Development Tools By Supplier
M68EVB908GB60E, M68DEMO908GB60E
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
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A.9
This section describes ac timing characteristics for each peripheral system. For detailed information about
how clocks for the bus are generated, see
Freescale Semiconductor
1
2
3
4
5
6
7
8
Self-clocked mode frequency is the frequency that the DCO generates when the FLL is open-loop.
Loss of reference frequency is the reference frequency detected internally, which transitions the ICG into self-clocked
mode if it is not in the desired range.
Loss of DCO frequency is the DCO frequency detected internally, which transitions the ICG into FLL bypassed external
mode (if an external reference exists) if it is not in the desired range.
This parameter is characterized before qualification rather than 100% tested.
Proper PC board layout procedures must be followed to achieve specifications.
This specification applies to the period of time required for the FLL to lock after entering FLL engaged internal or external
modes. If a crystal/resonator is being used as the reference, this specification assumes it is already running.
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V
percentage for a given interval.
See
Figure A-10
AC Characteristics
–60
Figure A-10. Internal Oscillator Deviation from Trimmed Frequency
–40
DDA
–20
and V
TEMPERATURE (°C)
MC9S08GB60A Data Sheet, Rev. 2
–0.1
0.1
SSA
0
Chapter 7, “Internal Clock Generator
and variation in crystal oscillator frequency increase the C
–0.2
–0.3
–0.4
–0.5
–0.6
20
20
60
Appendix A Electrical Characteristics
80
(S08ICGV2).”
2 V
3 V
100
Jitter
120
ICGOUT
275
.
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