MC9S12C32CFUE16 Freescale Semiconductor, MC9S12C32CFUE16 Datasheet - Page 672

• Manufacturer Part Number: MC9S12C32CFUE16
• Description: IC MCU 32K FLASH 16MHZ 80-QFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of MC9S12C32CFUE16

• Core Processor: HCS12
• Core Size: 16-Bit
• Speed: 16MHz
• Connectivity: CAN, EBI/EMI, SCI, SPI
• Peripherals: POR, PWM, WDT
• Number Of I /o: 60
• Program Memory Size: 32KB (32K x 8)
• Program Memory Type: FLASH
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 2.35 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 80-QFP
• Processor Series: S12C
• Core: HCS12
• Data Bus Width: 16 bit
• Data Ram Size: 2 KB
• Interface Type: CAN/SCI/SPI
• Maximum Clock Frequency: 16 MHz
• Number Of Programmable I/os: 60
• Number Of Timers: 8
• Operating Supply Voltage: - 0.3 V to + 6.5 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWHCS12
• Development Tools By Supplier: M68EVB912C32EE
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 8-ch x 10-bit
• For Use With: CML12C32SLK - KIT STUDENT LEARNING 16BIT HCS12
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Appendix A Electrical Characteristics
A.5.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to
3. Spec table quotes typical endurance evaluated at 25°C for this product family, typical endurance at various temperature can
672
Conditions are shown in Table A-4. unless otherwise noted
Num C
application.
25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please refer
to Engineering Bulletin EB618.
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer to
Engineering Bulletin EB619.
1
2
3
4
Javg
will not exeed 85°C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention after 10,000 program/erase cycles at an
C Data retention with <100 program/erase cycles at an
C Number of program/erase cycles
C Number of program/erase cycles
average junction temperature of T
average junction temperature T
(–40°C
(0°C
NVM Reliability
≤
T
≤
J
T
≤
J
140°C)
≤
0°C)
Table A-19. NVM Reliability Characteristics
Rating
Javg
MC9S12C-Family / MC9S12GC-Family
Javg
Flash Reliability Characteristics
≤
85°C
≤
85°C
Rev 01.24
Symbol
t
FLRET
n
FL
10,000
10,000
Min
15
20
(1)
100,000
100
100
Typ
—
(2)
2
Freescale Semiconductor
(3)
Max
—
—
—
—
Cycles
Years
Unit