MC9S08AC16CFDE Freescale Semiconductor, MC9S08AC16CFDE Datasheet - Page 293
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MC9S08AC16CFDE
Manufacturer Part Number
MC9S08AC16CFDE
Description
IC MCU 8BIT 16K FLASH 48-QFN
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet
1.MC9S08AC8CFGE.pdf
(336 pages)
Specifications of MC9S08AC16CFDE
Core Processor
HCS08
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
38
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
48-QFN
Processor Series
S08AC
Core
HCS08
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
SCI/SPI
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
38
Number Of Timers
8
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWS08
Development Tools By Supplier
DEMO9S08AC60E, DEMOACEX, DEMOACKIT, DCF51AC256, DC9S08AC128, DC9S08AC16, DC9S08AC60, DEMO51AC256KIT
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
Controller Family/series
HCS08
No. Of I/o's
38
Ram Memory Size
1KB
Cpu Speed
40MHz
No. Of Timers
3
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
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Appendix A
Electrical Characteristics and Timing Specifications
A.1
This section contains electrical and timing specifications.
A.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding, the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
Freescale Semiconductor
C
D
P
T
Introduction
Parameter Classification
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved by the design characterization by measuring a
statistically relevant sample size across process variations.
Those parameters are achieved by design characterization on a small sample size
from typical devices under typical conditions unless otherwise noted. All values
shown in the typical column are within this category.
Those parameters are derived mainly from simulations.
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
Table A-1. Parameter Classifications
MC9S08AC16 Series Data Sheet, Rev. 8
Table A-2
NOTE
may affect device reliability or cause
293
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