ST62T03CM3 STMicroelectronics, ST62T03CM3 Datasheet - Page 73

IC MCU 8BIT W/ADC 16-SOP

ST62T03CM3

Manufacturer Part Number
ST62T03CM3
Description
IC MCU 8BIT W/ADC 16-SOP
Manufacturer
STMicroelectronics
Series
ST6r
Datasheet

Specifications of ST62T03CM3

Core Processor
ST6
Core Size
8-Bit
Speed
8MHz
Peripherals
LVD, POR, WDT
Number Of I /o
9
Program Memory Size
1KB (1K x 8)
Program Memory Type
OTP
Ram Size
64 x 8
Voltage - Supply (vcc/vdd)
3 V ~ 6 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 125°C
Package / Case
16-SOIC (0.300", 7.5mm Width)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Data Converters
-
Connectivity
-
Other names
497-8232
ST62T03CM3
10.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
10.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested 10 µF and 0.1 µF decoupling capacitors on the power supply lines are proposed as a good price vs.
Figure 50. EMC Recommended Star Network Power Supply Connection
Symbol
EMC performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC rec-
ommendations are given in other sections (I/Os, RESET, OSCx pin characteristics).
V
V
FESD
FFTB
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
POWER
SUPPLY
SOURCE
Parameter
V
DD
DD
and V
ST6
DIGITAL NOISE
FILTERING
(close to the MCU)
DD
Doc ID 4563 Rev 5
pins
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
DD
DD
10 µF
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
0.1 µF
A
A
Conditions
+25°C, f
+25°C, f
V
V
DD
SS
OSC
OSC
ST6200C ST6201C ST6203C
8MHz
8MHz
ST62XX
2)
Neg
-2.5
-2
DD
1)
and V
Pos
2
3
SS
1)
through
73/100
Unit
kV
1

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