SW500007 Microchip Technology, SW500007 Datasheet - Page 261

• Manufacturer Part Number: SW500007
• Description: PICC-18 PRO
• Manufacturer: Microchip Technology
• Type: Compilerr
• Series: PIC18r

Specifications of SW500007

• Supported Families: PIC18
• Core Architecture: PIC
• Software Edition: Professional
• Kit Contents: Software And Docs
• Mcu Supported Families: PIC18
• Tool Function: Compiler
• Tool Type: Compiler
• Lead Free Status / RoHS Status: Not applicable / RoHS Compliant
• For Use With/related Products: PIC18 Series
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 015P; 778-1002; 778-1002

Library Functions
RAM_TEST_FAILED
Synopsis
void ram_test_failed (unsigned char errcode)
Description
The ram_test_failed() function is not intended to be called from within the general execution of
the program. This routine is called during execution of the generated runtime startup code if the
program is using a compiler generated RAM integrity test and the integrity test detects a bad cell.
This function is passed a single byte error code as a parameter. The address that failed this test
will be loaded in the FSR0 registers. The failed value will still be accessable through the INDF0
register. The default operation of this routine will halt program execution if a bad cell is detected,
however the user is free to enhance this functionality if required.
See Also
__ram_cell_test
Note
This routine is intended to be replaced by an equivalent routine to suit the user’s implementation.
Possible enhancements include logging the location of the dead cell and continuing to test if there
are any more more dead cells, or alerting the outside world that the device has a memory problem.
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