DS28EA00U+ Maxim Integrated Products, DS28EA00U+ Datasheet - Page 4

• Manufacturer Part Number: DS28EA00U+
• Description: IC THERMOMETER 1-WIRE 8-USOP
• Manufacturer: Maxim Integrated Products

Specifications of DS28EA00U+

• Function: Thermometer, Thermostat
• Topology: Register Bank, Scratchpad
• Sensor Type: Internal
• Sensing Temperature: -40°C ~ 85°C
• Output Type: Digital
• Output Alarm: Yes
• Output Fan: No
• Voltage - Supply: 3 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 8-MSOP, Micro8™, 8-uMAX, 8-uSOP,
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

1-Wire Digital Thermometer with
Sequence Detect and PIO
ELECTRICAL CHARACTERISTICS (continued)
(T
Note 1:
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
Note 9:
Note 10: After V
Note 11: The I-V characteristic is linear for voltages less than +1V.
Note 12: Applies to a single parasitically powered DS28EA00 attached to a 1-Wire line. These values also apply to networks of
Note 13: The earliest recognition of a negative edge is possible at t
Note 14: Defines maximum possible bit rate. Equal to 1/(t
Note 15: Interval during the negative edge on IO at the beginning of a presence-detect pulse between the time at which the voltage
Note 16: Interval after t
Note 17: ε in Figure 13 represents the time required for the pullup circuitry to pull the voltage on IO up from V
Note 18: δ in Figure 13 represents the time required for the pullup circuitry to pull the voltage on IO up from V
Note 19: This load current is caused by the internal weak pullup, which asserts a logic 1 to the PIOB and PIOA pins. The logical
Note 20: Current drawn from IO during EEPROM programming or temperature conversion interval in parasite-powered mode. The
Note 21: The t
Note 22: Write-cycle endurance is degraded as T
Note 23: Not 100% production tested. Guaranteed by reliability monitor sampling.
Note 24: Data retention is degraded as T
Note 25: Guaranteed by 100% production test at elevated temperature for a shorter time; equivalence of this production test to data
Note 26: The t
Note 27: Drift data is preliminary and based on a 1000-hour stress test performed on another device with comparable design and
4
A
= -40°C to +85°C.) (Note 1)
_______________________________________________________________________________________
Specifications at T
System requirement.
Guaranteed by design, characterization, and/or simulation only. Not production tested.
Maximum allowable pullup resistance is a function of the number of 1-Wire devices in the system and 1-Wire recovery
times. The specified value here applies to parasitically powered systems with only one device and with the minimum
1-Wire recovery times. For more heavily loaded systems, local power or an active pullup such as that found in the
DS2482-x00, DS2480B, or DS2490 may be required. If longer t
Value is 25pF maximum with local power. Maximum value represents the internal parasite capacitance when V
applied. If R
V
capacitive loading on IO. Lower V
ues of V
Voltage below which, during a falling edge on IO, a logic 0 is detected.
The voltage on IO must be less than or equal to V
Voltage above which, during a rising edge on IO, a logic 1 is detected.
multiple DS28EA00 with local supply.
is 80% of V
Minimum limit is t
maximum duration for the master to pull the line low is t
threshold of the bus master. The actual maximum duration for the master to pull the line low is t
state of PIOB must not change during the execution of the Conditional Read ROM command.
pullup circuit on IO during the programming or temperature conversion interval should be such that the voltage at IO is
greater than or equal to V
can be activated during programming or temperature conversions, may need to be added. The bypass must be activated
within 10µs from the beginning of the t
Copy Scratchpad sequence. Interval ends once the device’s self-timed EEPROM programming cycle is complete and the
current drawn by the device has returned from I
sheet limit at operating temperature range is established by reliability testing.
convert temperature sequence. The interval ends once the device’s self-timed temperature conversion cycle is complete
and the current drawn by the device has returned from I
fabricated in the same manufacturing process. This test was performed at greater than +85°C with V
Confirmed thermal drift results for this device are pending the completion of a new 1000-hour stress test.
TL
, V
PROG
CONV
TH
TH
TL
, and V
is crossed during a rising edge on IO, the voltage on IO must drop by at least V
, V
interval begins t
interval begins t
PUP
PUP
TH
RSTL
, and V
and the time at which the voltage is 20% of V
HY
= 2.2kΩ, 2.5µs after V
PDHMAX
A
are a function of the internal supply voltage, which is a function V
during which a bus master is guaranteed to sample a logic 0 on IO if there is a DS28EA00 present.
= -40°C are guaranteed by design and not production tested.
HY
.
PUPMIN
+ t
REHMAX
REHMAX
FPDMAX
A
. If V
increases.
DD
after the trailing rising edge on IO for the last time slot of the command byte for a valid
after the trailing rising edge on IO for the last time slot of the command byte for a valid
; the maximum limit is t
, V
PUP
PUP
PROG
PUP
A
has been applied, the parasite capacitance does not affect normal communications.
in the system is close to V
increases.
, higher R
or t
CONV
PROG
W0LMIN
ILMAX
PUP
interval, respectively.
to I
W1LMAX
at all times when the master drives the line to a logic 0.
+ t
CONV
, shorter t
L
REH
RECMIN
(parasite power) or I
PDHMIN
PUP
to I
after V
REC
+ t
.
L
REC
).
F
(parasite power) or I
+ t
is used, higher R
PUPMIN
- ε and t
TH
, and heavier capacitive loading all lead to lower val-
PDLMIN
has been reached on the preceding rising edge.
, then a low-impedance bypass of R
W0LMAX
.
DDS
(local power).
DD
PUP
+ t
, V
DDS
F
values may be tolerable.
- ε, respectively.
PUP
HY
(local power).
to be detected as logic 0.
, R
RLMAX
PUP
, 1-Wire timing, and
IL
IL
DD
+ t
to V
to the input-high
= +5.5V.
F
.
TH
. The actual
PUP
PUP
, which
is first