LH28F160S3HT-L10A Sharp Microelectronics, LH28F160S3HT-L10A Datasheet - Page 35

• Manufacturer Part Number: LH28F160S3HT-L10A
• Description: IC FLASH 16MBIT 100NS 56TSOP
• Manufacturer: Sharp Microelectronics

Specifications of LH28F160S3HT-L10A

• Rohs Status: RoHS non-compliant
• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 16M (2M x 8 or 1M x 16)
• Speed: 100ns
• Interface: Parallel
• Voltage - Supply: 3 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 56-TSOP
• Other names: 425-1839; LHF16KA7

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6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
Figure 16. Transient Equivalent Testing
DEVICE
UNDER
TEST
Input rise and fall times (10% to 90%) <10 ns.
Input rise and fall times (10% to 90%) <10 ns.
AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.35V.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
2.7
0.0
3.0
0.0
C
L
Capacitance
Includes Jig
Figure 15. Transient Input/Output Reference Waveform for V
Figure 14. Transient Input/Output Reference Waveform for V
Load Circuit
INPUT
INPUT
1.3V
R
C
L
1N914
=3.3kΩ
L
1.35
1.5
OUT
LHF16KA7
TEST POINTS
TEST POINTS
Test Configuration Capacitance Loading Value
V
CC
Test Configuration
=3.3V±0.3V, 2.7V-3.6V
CC
CC
=3.3V±0.3V
=2.7V-3.6V
1.35
1.5
OUTPUT
OUTPUT
C
L
50
(pF)
Rev. 2.0
33