K4H560438D-TC SAMSUNG [Samsung semiconductor], K4H560438D-TC Datasheet - Page 25

• Manufacturer Part Number: K4H560438D-TC
• Description: 256Mb
• Manufacturer: SAMSUNG [Samsung semiconductor]

K4H561638D
AC Operating Test Conditions
Input/Output Capacitance
(VDD=2.5, VDDQ=2.5V, TA= 25 C, f=1MHz)
(V
Input reference voltage for Clock
Input signal maximum peak swing
Input signal minimum slew rate (for imput only)
Input slew rate (I/O pins)
Input Levels(V
Input timing measurement reference level
Output timing measurement reference level
Output load condition
Input capacitance
(A0 ~ A12, BA0 ~ BA1, CKE, CS, RAS,CAS, WE)
Input capacitance( CK, CK )
Data & DQS input/output capacitance
Input capacitance(DM)
DD
=2.5V, V
DDQ
IH
/V
=2.5V, T
IL
Parameter
Parameter
)
A
Output
= 0 to 70 C)
Output Load Circuit (SSTL_2)
Z0=50
C
LOAD
=30pF
- 25 -
V
tt
Symbol
COUT
=0.5*V
CIN1
CIN2
CIN3
R
DDQ
T
V
=50
REF
See Load Circuit
V
=0.5*V
REF
Min
4.0
4.0
+0.31/V
0.5 * V
2
2
Value
V
1.5
0.5
0.5
V
DDQ
REF
tt
DDQ
REF
Max
-0.31
3.0
3.0
5.0
5.0
Rev. 0.4 May. 2002
Delta Cap(max)
0.25
0.5
0.5
DDR SDRAM
Unit
V/ns
V/ns
V
V
V
V
V
Note
Unit
pF
pF
pF
pF