AM29F010-1 Advanced Micro Devices, AM29F010-1 Datasheet

no-image

AM29F010-1

Manufacturer Part Number
AM29F010-1
Description
1 Megabit (128 K x 8-Bit) CMOS 5.0 Volt-only/ Uniform Sector Flash Memory-Die Revision 1
Manufacturer
Advanced Micro Devices
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AM29F010-120EC
Manufacturer:
ZILOG
Quantity:
6 960
Part Number:
AM29F010-120EC
Manufacturer:
VPT
Quantity:
5
Part Number:
AM29F010-120EI
Manufacturer:
AMD
Quantity:
6 250
Part Number:
AM29F010-120JC
Quantity:
28
Part Number:
AM29F010-120JC
Manufacturer:
AMD
Quantity:
1 000
Part Number:
AM29F010-120JC
Manufacturer:
AMD
Quantity:
20 000
Part Number:
AM29F010-120JI
Manufacturer:
AMD
Quantity:
11 698
Part Number:
AM29F010-120JI
Quantity:
1 935
Part Number:
AM29F010-120JI
Manufacturer:
AMD
Quantity:
20 000
Part Number:
AM29F010-120PC
Manufacturer:
AMD
Quantity:
20 000
Part Number:
AM29F010-125PC
Manufacturer:
AMD
Quantity:
20 000
Part Number:
AM29F010-150EC
Manufacturer:
AMD
Quantity:
6 690
Am29F010 Known Good Die
1 Megabit (128 K x 8-Bit)
CMOS 5.0 Volt-only, Uniform Sector Flash Memory—Die Revision 1
DISTINCTIVE CHARACTERISTICS
1/13/98
Single power supply operation
— 5.0 V
— Simplifies system-level power requirements
High performance
— 90 or 120 ns maximum access time
Low power consumption
— 30 mA max active read current
— 50 mA max program/erase current
— <25 A typical standby current
Flexible sector architecture
— Eight uniform sectors
— Any combination of sectors can be erased
— Supports full chip erase
Sector protection
— Hardware-based feature that disables/re-
— Sector protection/unprotection can be
operations
enables program and erase operations in any
combination of sectors
implemented using standard PROM
programming equipment
SUPPLEMENT
10% for read, erase, and program
Embedded Algorithms
— Embedded Erase algorithm automatically
— Embedded Program algorithm automatically
Minimum 100,000 program/erase cycles
guaranteed
Compatible with JEDEC standards
— Pinout and software compatible with
— Superior inadvertent write protection
Data Polling and Toggle Bits
— Provides a software method of detecting
Tested to datasheet specifications at
temperature
Quality and reliability levels equivalent to
standard packaged components
pre-programs and erases the chip or any
combination of designated sector
programs and verifies data at specified address
single-power-supply flash
program or erase cycle completion
Publication# 21116
Issue Date: January 1998
Rev: B Amendment/0

Related parts for AM29F010-1

AM29F010-1 Summary of contents

Page 1

... SUPPLEMENT Am29F010 Known Good Die 1 Megabit (128 K x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory—Die Revision 1 DISTINCTIVE CHARACTERISTICS Single power supply operation — 5.0 V 10% for read, erase, and program operations — Simplifies system-level power requirements High performance — 120 ns maximum access time Low power consumption — ...

Page 2

... GENERAL DESCRIPTION The Am29F010 in Known Good Die (KGD) form Mbit, 5.0 Volt-only Flash memory. AMD defines KGD as standard product in die form, tested for functionality and speed. AMD KGD products have the same reli- ability and quality as AMD products in packaged form. Am29F010 Features The Am29F010 device is organized as eight uniform sectors of 16 Kbytes each for flexible erase capability ...

Page 3

... DIE PAD LOCATIONS 1/13/ AMD logo location Am29F010 Known Good Die Am29F010 KGD -90 -120 90 120 90 120 35 50 Orientation relative to leading edge of tape and reel ...

Page 4

... Am29F010 Known Good Die Pad Center (millimeters 0.00 0.00 –0.84 –0.03 –1.06 –0.03 –1.27 –0.03 –1.48 –0.03 –1.69 –0.03 –1.91 –0.03 –1.89 –0.27 –1.92 –4.02 –1.76 –4.24 –1.42 –4.24 – ...

Page 5

... Am29F010 DP Valid Combinations Am29F010-90 DPC 1, DPI 1, DPE 1, DGC 1, DGI 1, DGE 1, DTC 1, DTI 1, DTE 1, Am29F010-120 DWC 1, DWI 1, DWE 1 1/13/ DIE REVISION This number refers to the specific AMD manufacturing process and product technology reflected in this document ...

Page 6

... PRODUCT TEST FLOW Figure 1 provides an overview of AMD’s Known Good Die test flow. For more detailed information, refer to the Am29F010 product qualification database supplement for KGD. AMD implements quality assurance proce- dures throughout the product test flow. In addition, an High Temperature Packaging for Shipment ...

Page 7

... For best yield, AMD recommends assembly in a Class 10K clean room with 30% to 60% relative humidity. Storage (max) = 130 C Store at a maximum temperature nitrogen- J (max) = 140 C purged cabinet or vacuum-sealed bag. Observe all J standard ESD handling procedures. Am29F010 Known Good Die 7 ...

Page 8

... Buyer’s own risk and Buyer agrees to fully indem- nify AMD for any damages resulting in such use or sale. REVISION SUMMARY FOR AM29F010 KNOWN GOOD DIE Formatted to match current template. Updated Distinc- tive Characteristics and General Description sections using the current main data sheet. Am29F010 Known Good Die 1/13/98 ...

Related keywords