ISPLSI3256E-100LB320 Lattice Semiconductor, ISPLSI3256E-100LB320 Datasheet - Page 5

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ISPLSI3256E-100LB320

Manufacturer Part Number
ISPLSI3256E-100LB320
Description
In-System Programmable High Density PLD
Manufacturer
Lattice Semiconductor
Datasheet
1. One output at a time for a maximum duration of one second. V
2. Measured using sixteen 16-bit counters.
3. Typical values are at V
4. Maximum I
Output Load conditions (See Figure 2)
3-state levels are measured 0.5V from
steady-state active level.
V
V
I
I
I
I
I
I
SYMBOL
Switching Test Conditions
DC Electrical Characteristics
IL
IH
IL-isp
IL-PU
OS
CC
Input Pulse Levels
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
by tester ground degradation. Characterized but not 100% tested.
section of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate
maximum I
OL
OH
C
A
B
1
2,4
TEST CONDITION
Active High
Active Low
Active High to Z
at V -0.5V
Active Low to Z
at V +0.5V
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
Bscan/ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
CC
CC
OH
OL
.
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
CC
PARAMETER
= 5V and T
470Ω
470Ω
470Ω
Over Recommended Operating Conditions
R1
A
≤ 3ns 10% to 90%
= 25°C.
GND to 3.0V
See Figure 2
390Ω
390Ω
390Ω
390Ω
390Ω
R2
1.5V
1.5V
Table 2-0003/3256E
Table 2 - 0004A
35pF
35pF
35pF
5pF
5pF
CL
I = 8 mA
I
0V ≤ V ≤ V (Max.)
3.5V ≤ V ≤ V
0V ≤ V ≤ V
0V ≤ V ≤ V
V = 5V, V
V = 0.0V, V = 3.0V
f
TOGGLE
OL
OH
CC
IL
5
= -4 mA
Figure 2. Test Load
OUT
IN
IN
IN
= 1 MHz
IN
= 0.5V was selected to avoid test problems
Specifications ispLSI 3256E
*
CONDITION
Device
Output
C L includes Test Fixture and Probe Capacitance.
OUT
IL
IL
IL
IH
CC
= 0.5V
+ 5V
MIN.
2.4
R 1
R 2
TYP.
300
C L
3
*
Table 2 - 0007isp/3256E
MAX. UNITS
-150
-150
-200
0.4
-10
10
Point
Test
0213A
mA
mA
µA
µA
µA
µA
V
V

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