HCS11MS Intersil Corporation, HCS11MS Datasheet - Page 4

• Manufacturer Part Number: HCS11MS
• Description: Radiation Hardened Triple 3-Input AND Gate
• Manufacturer: Intersil Corporation

NOTES:
NOTE:
NOTE:
Data to Output
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500 , CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests VO
1. Alternate group A inspection in accordance with method 5005 of MIL-STD-883 may be exercised.
1. Except FN test which will be performed 100% Go/No-Go.
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC BURN-IN I TEST CONDITIONS (Note 1)
PARAMETERS
CONFORMANCE
OPEN
CONFORMANCE GROUPS
GROUPS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
SYMBOL
ICC
IOL/IOH
Subgroup B-5
Subgroup B-6
TPHL
TPLH
4.0V is recognized as a logic “1”, and VO
GROUND
METHOD
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
PARAMETER
5005
VCC = 4.5V
VCC = 4.5V
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Specifications HCS11MS
CONDITIONS
(NOTES 1, 2)
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
1/2 VCC = 3V 0.5V
METHOD
PRE RAD
1, 7, 9
SUBGROUP
GROUP B
7-138
5
5
TEST
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
0.5V is recognized as a logic “0”.
GROUP A SUBGROUPS
POST RAD
ERATURE
2, 3, 8A, 8B, 10, 11
VCC = 6V
TEMP-
+25
+25
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
o
o
C
C
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
-15% of 0 Hour
DELTA LIMIT
200K RAD LIMITS
0.5V
MIN
2
2
3 A
PRE RAD
MAX
20
22
1, 9
READ AND RECORD
50kHz
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
o
1M RAD LIMITS
C)
READ AND RECORD
OSCILLATOR
MIN
2
2
Table 4 (Note 1)
MAX
POST RAD
25
28
25kHz
UNITS
ns
ns