MLX90313KDF ETC [List of Unclassifed Manufacturers], MLX90313KDF Datasheet - Page 21

• Manufacturer Part Number: MLX90313KDF
• Description: Programmable IR Sensor Interface
• Manufacturer: ETC [List of Unclassifed Manufacturers]

Eeprom Description
MLX90313 contains 128 x 16 EEPROM memory. The memory can be accessed through the serial
interface. The 11 most significant bits are data bits and the 5 less significant bits are control bits used for
the Error Check and Correction system (ECC). After POR the ASIC reads the full eeprom contents,
checks it and corrects the single errors (1 wrong bit per address). If higher order error is discovered then
the bit ‘fatal error’ will be set (see Confreg1 description in previous section).
The memory has two levels of protection. After POR the write access to the eeprom will be disabled. The
external unit can remove this level of protection writing proper data in WP register. In this case all
addresses in range 08-77h will be available for write access. The first and last 8 addresses will still be
disabled. The write access to these cells is available only if the write protection is removed and the chip is
in test mode.
Eeprom map overview
Address list eeprom
Register name
IRGAIN1
IRGAIN2
TEMPGAIN
CONFREG1
CONFREG2
OSCCTRL
BGCTRL
LPF
CALIBRATION
IOS-TEMP
IOS-IR
RESERVED
THCOMP1
HSCOMP1
THREL1
HSREL1
RESERVED
CHIP-ID
*WP: Write access to EEprom is controlled by the content of the internal register WP
**Test mode: Write access controlled by the internal register WP and only available in test mode
The last 8 addresses 0x78 to 0x7F are free to use for the user. They can hold some calibration data or
identification number. All data programmed into the eeprom must pass the error checking. Therefore, one
must add 5 hamming bits to the eeprom data, in the 5 least significant bits.
MLX90313 Programmable IR sensor Interface
3901090313
Function
Temp-chain settings
Low Pass Filter
Initial offset Temp-chain
IR-chain settings
IR-chain settings
Configuration
Configuration
Oscillator control
Bandgap control
Look up table
linearisation.
Initial offset IR-chain
Threshold for comparator
Comp1
Hysteresis for comparator
Comp1
Threshold for comparator
of Rel1
Hysteresis for comparator
of Rel1
Data
Address
Dec
2
3
4
6
7
8-111
112
113
114
115
116
117
118
119
0
1
5
120-127
Page 21
Hex
02h
03h
04h
05h
06h
07h
08h-6Fh
70h
71h
72h
73h
74h
75h
76h
77h
78h-7Fh
00h
01h
Programmable IR Sensor Interface
test mode
test mode
WP*
WP
WP
WP
WP
WP
WP
WP
test mode
Write access
test mode**
test mode
test mode
test mode
test mode
test mode
MLX90313
Rev 1.0 21-July-2001