GTL2003 Philips Semiconductors (Acquired by NXP), GTL2003 Datasheet - Page 10

• Manufacturer Part Number: GTL2003
• Manufacturer: Philips Semiconductors (Acquired by NXP)

NXP Semiconductors
12. Dynamic characteristics
GTL2003_1
Product data sheet
12.1 Dynamic characteristics for translator-type application
Table 10.
T
GND = 0 V; t
[1]
[2]
[3]
Symbol
t
t
PLH
PHL
amb
Fig 7. The input (Sn) to output (Dn) propagation delays
All typical values are measured at V
Propagation delay is measured using
and is guaranteed by ON-state resistance.
C
= 40 C to +85 C; V
io(on)
V
maximum of 30 pF and C
M
Dynamic characteristics
Parameter
LOW-to-HIGH
propagation delay
HIGH-to-LOW
propagation delay
= 1.5 V; V
r
= t
f
3.0 ns; unless otherwise specified. Refer to
HIGH-to-LOW
HIGH-to-LOW
LOW-to-HIGH
LOW-to-HIGH
test jig output
I
= GND to 3.0 V.
DUT output
Rev. 01 — 27 July 2007
ref
input
= 1.365 V to 1.635 V; V
io(off)
DD1
maximum of 15 pF is guaranteed by design.
Figure 9
V
Conditions
Sn to Dn; Dn to Sn
Sn to Dn; Dn to Sn
= 3.3 V, V
M
V
M
and is a difference measurement. It is not production tested
t
PHL
V
DD2
M
8-bit bidirectional low voltage translator
= 2.5 V, V
DD1
V
= 3.0 V to 3.6 V; V
M
ref
V
M
Figure
[2][3]
[2][3]
= 1.5 V and T
t
PLH
V
M
Min
0.5
0.5
9.
002aad197
V
GND
V
V
V
V
amb
DD2
I
DD2
OL
DD2
OL
Typ
1.5
1.5
GTL2003
© NXP B.V. 2007. All rights reserved.
= 25 C.
= 2.36 V to 2.64 V;
[1]
Max
5.5
5.5
10 of 19
Unit
ns
ns