MC74HC1G00DTT1G ON Semiconductor, MC74HC1G00DTT1G Datasheet - Page 2

• Manufacturer Part Number: MC74HC1G00DTT1G
• Description: IC GATE NAND SGL 2INPUT SOT23-5
• Manufacturer: ON Semiconductor
• Series: 74HCr

Specifications of MC74HC1G00DTT1G

• Logic Type: NAND Gate
• Number Of Inputs: 2
• Number Of Circuits: 1
• Current - Output High, Low: 2.6mA, 2.6mA
• Voltage - Supply: 2 V ~ 6 V
• Operating Temperature: -55°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: TSOT-23-5, TSOT-5, TSOP-5
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: MC74HC1G00DTT1GOS; MC74HC1G00DTT1GOS; MC74HC1G00DTT1GOSTR

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
MAXIMUM RATINGS
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
V
V
V
I
I
I
I
T
T
T
q
P
MSL
F
V
I
V
V
V
T
t
LATCHUP
Symbol
IK
OK
OUT
CC
r
JA
Symbol
A
Temperature C
STG
L
J
R
CC
IN
OUT
D
ESD
CC
IN
OUT
, t
f
Junction
100
120
130
140
110
80
90
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink Current
DC Supply Current per Supply Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance
Power Dissipation in Still Air at 85_C
Moisture Sensitivity
Flammability Rating
ESD Withstand Voltage
Latchup Performance
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Operating Temperature Range
Input Rise and Fall Time
Time, Hours
1,032,200
419,300
178,700
79,600
37,000
17,800
8,900
Parameter
Time, Years
Parameter
Above V
117.8
47.9
20.4
9.4
4.2
2.0
1.0
http://onsemi.com
CC
MC74HC1G00
and Below GND at 125_C (Note 5)
Charged Device Model (Note 4)
Human Body Model (Note 2)
2
SC70−5/SC−88A (Note 1)
Machine Model (Note 3)
Oxygen Index: 28 to 34
Figure 3. Failure Rate vs. Time Junction Temperature
V
V
V
V
CC
CC
CC
CC
= 2.0 V
= 3.0 V
= 4.5 V
= 6.0 V
SC70−5/SC−88A
1
1
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
TSOP−5
TSOP−5
*55
Min
2.0
0.0
0.0
0
0
0
0
10
UL 94 V−0 @ 0.125 in
TIME, YEARS
*0.5 to V
*0.5 to V
*0.5 to )7.0
*65 to )150
Level 1
u2000
$12.5
)150
u200
$500
Value
$20
$20
$25
260
350
230
150
200
N/A
CC
CC
)125
1000
Max
V
V
600
500
400
6.0
)0.5
)0.5
100
CC
CC
1000
_C/W
Unit
Unit
mW
mA
mA
mA
mA
mA
_C
_C
_C
_C
ns
V
V
V
V
V
V
V