gal26v12 Lattice Semiconductor Corp., gal26v12 Datasheet - Page 12

• Manufacturer Part Number: gal26v12
• Description: High Performance E2 Cmos Pld Generic Array Logictm Gal26v12 Gal
• Manufacturer: Lattice Semiconductor Corp.

3-state levels are measured 0.5V from steady-state active
level.
Output Load Conditions (see figure)
fmax DESCRIPTIONS
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
SWITCHING TEST CONDITIONS
Test Condition
A
B
C
Active High
Active Low
Active High
Active Low
f
max with External Feedback 1/(
Note: fmax with external feedback is cal-
culated from measured tsu and tco.
Note: fmax with no feedback may be less
than 1/twh + twl. This is to allow for a clock
duty cycle of other than 50%.
L O G I C
A R R A Y
L O G I C
A R R A Y
f
max With No Feedback
t
s u
300
300
300
R
1
R E G I S T E R
R E G I S T E R
C L K
C L K
390
390
390
390
390
R
2ns 10% – 90%
2
t
t
GND to 3.0V
c o
See Figure
su+
1.5V
1.5V
t
co)
50pF
50pF
50pF
5pF
5pF
C
L
12
FROM OUTPUT (O/Q)
UNDER TEST
*C
Note: tcf is a calculated value, derived by sub-
tracting tsu from the period of fmax w/internal
feedback (tcf = 1/fmax - tsu). The value of tcf is
used primarily when calculating the delay from
clocking a register to a combinatorial output
(through registered feedback), as shown above.
For example, the timing from clock to a combi-
natorial output is equal to tcf + tpd.
L
Specifications GAL26V12
f
INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
max with Internal Feedback 1/(
L O G I C
A R R A Y
R
2
t
c f
t
+5V
p d
R E G I S T E R
C L K
R
1
t
su+
C *
L
t
cf)
TEST POINT