s-8241abkpg-kbktfg Seiko Instruments Inc., s-8241abkpg-kbktfg Datasheet - Page 14

• Manufacturer Part Number: s-8241abkpg-kbktfg
• Description: Battery Protection Ic For 1-cell Pack
• Manufacturer: Seiko Instruments Inc.

*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
14
DELAY TIME (Ta = 25°C)
DELAY TIME (Ta = −40°C to +85°C)
DELAY TIME (Ta = 25°C)
DELAY TIME (Ta = −40°C to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8241 Series
design, not tested in production.
design, not tested in production.
(5) S-8241ADF, S-8241ADG
(6) S-8241AEE
Item
Item
*1
*1
Symbol
t
t
t
t
t
t
t
t
t
t
Symbol
t
t
t
t
t
t
t
t
t
t
CU
DL
lOV1
lOV2
SHORT
CU
DL
IOV1
IOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
IOV1
IOV2
SHORT
Seiko Instruments Inc.
Condition
Condition
Table 14
Table 15




















0.175
0.138
Min.
Min.
87.5
0.55
1.4
1.1
0.7
1.4
1.1
21
11

17

11

69

9
9
Typ.
0.25
0.25
Typ.
125
125
1.0
1.0
31
16
10
31
16
10
16
10
16
10
2
2
2
2
0.325
0.425
162.5
Max.
Max.
212
2.6
3.4
1.3
2.6
1.7
3.4
41
21
50
53
27
73
21
50
27
73
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
s
s
s
Condition
Condition
Rev.8.1
Test
Test
8
8
9
9
9
8
8
9
9
9
8
8
9
9
9
8
8
9
9
9
Circuit
Circuit
Test
Test
_00
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1