s-8241abkpg-kbktfg Seiko Instruments Inc., s-8241abkpg-kbktfg Datasheet - Page 13

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s-8241abkpg-kbktfg

Manufacturer Part Number
s-8241abkpg-kbktfg
Description
Battery Protection Ic For 1-cell Pack
Manufacturer
Seiko Instruments Inc.
Datasheet
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by
DELAY TIME (Ta = 25°C)
DELAY TIME (Ta = −40°C to +85°C)
DELAY TIME (Ta = 25°C)
DELAY TIME (Ta = −40°C to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Rev.8.1
design, not tested in production.
design, not tested in production.
(3) S-8241ABW, S-8241ABY
(4) S-8241ABR, S-8241ACD
_00
Item
Item
*1
*1
Symbol
t
t
t
t
t
t
t
t
t
t
Symbol
t
t
t
t
t
t
t
t
t
t
CU
DL
lOV1
lOV2
SHORT
CU
DL
IOV1
IOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
IOV1
IOV2
SHORT
Seiko Instruments Inc.
BATTERY PROTECTION IC FOR 1-CELL PACK
Condition
Condition
Table 12
Table 13
0.175
0.138
Min.
87.5
Min.
87.5
5.6
1.4
4.4
1.1
1.4
5.6
1.4
1.1
4.4
1.1
69
69
Typ.
0.25
0.25
Typ.
125
125
125
125
2.0
2.0
10
10
10
10
8
2
8
2
8
2
8
2
0.325
162.5
0.425
162.5
Max.
Max.
10.4
10.4
212
212
2.6
3.4
2.6
2.6
3.4
3.4
50
14
73
50
14
73
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
s
s
s
s
S-8241 Series
Condition
Condition
Test
Test
8
8
9
9
9
8
8
9
9
9
8
8
9
9
9
8
8
9
9
9
Circuit
Circuit
Test
Test
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
13

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