SA5214D/01,112 NXP Semiconductors, SA5214D/01,112 Datasheet - Page 5

• Manufacturer Part Number: SA5214D/01,112
• Description: IC POSTAMP STATUS IND 20-SOIC
• Manufacturer: NXP Semiconductors
• Type: Postamplifierr

Specifications of SA5214D/01,112

• Applications: Optical Networks
• Mounting Type: Surface Mount
• Package / Case: 20-SOIC (7.5mm Width)
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 935275246112; SA5214D/01; SA5214D/01

1. The SA5214 is capable of detecting a much lower input level. Operation under 12mV
Philips Semiconductors
AC ELECTRICAL CHARACTERISTICS
Min and Max limits apply over the operating temperature range at V
V
NOTES:
1998 Oct 07
f
BW
V
V
R
C
R
C
R
C
V
V
t
t
t
t
CCA
OP
TLH
THL
RFD
PWD
SYMBOL
SYMBOL
INH
INL
HYS
THR
Postamplifier with link status indicator
IN1
IN1
IN2
IN2
OUT1
OUT1
testers.
A1
= V
CCD
Pulse width distortion of output
= +5.0V and T
Maximum operating frequency
Small signal bandwidth (differential
OUT
Maximum Functional A1
input signal (single ended)
Minimum Functional A1
input signal (single ended)
Input resistance
(differential at IN
Input capacitance (differential at IN
Input resistance
(differential at IN
Input capacitance (differential at IN
Output resistance (differential at OUT
Output capacitance (differential at
OUT
Hysteresis voltage
Threshold voltage range (FLAG ON)
TTL Output Rise Time
20% to 80%
TTL Output Fall Time
80% to 20%
t
TLH
/t
1
1
THL
/IN
)
1
mismatch
)
A
PARAMETER
PARAMETER
= 25 C.
1
2
)
)
50mV
Distortion=
1
2
)
)
P-P
1
)
, 1010. . .input
Test circuit, @ 50MHz R
T
T
H
H
+T
-T
TEST CONDITIONS
TEST CONDITIONS
CCA
L
L
R
Test CIrcuit
5
Test Circuit
Test Circuit
Test Circuit
= V
THRESH
Test circuit
Test circuit
Test circuit
10
CCD
2
=47k
= +5.0V unless otherwise specified. Typical data applies at
1
2.5
RHYST
P-P
=5k
cannot be guaranteed by present day automatic
Min
60
LIMITS
1200
1200
Typ
1.6
1.3
1.2
0.1
75
75
12
25
12
2
2
2
3
2.5
Product specification
Max
SA5214
mV
mV
mV
UNIT
UNIT
MHz
MHz
V
pF
pF
pF
ns
ns
ns
P-P
P-P
P-P
P-P
%