CAT25C256K-TE13 ON Semiconductor, CAT25C256K-TE13 Datasheet - Page 2

• Manufacturer Part Number: CAT25C256K-TE13
• Manufacturer: ON Semiconductor

Specifications of CAT25C256K-TE13

• Density: 256Kb
• Interface Type: Serial (SPI)
• Organization: 32Kx8
• Access Time (max): 250ns
• Frequency (max): 3MHz
• Write Protection: Yes
• Data Retention: 100Year
• Operating Supply Voltage (typ): 3.3/5V
• Package Type: SOIC EIAJ
• Operating Temp Range: 0C to 70C
• Supply Current: 10mA
• Operating Supply Voltage (min): 2.5V
• Operating Supply Voltage (max): 6V
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 8
• Lead Free Status / Rohs Status: Not Compliant

ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55 C to +125 C
Storage Temperature ....................... –65 C to +150 C
Voltage on any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
Doc. No. 25088-00 8/99 SPI-1
CC
CC
Symbol
Symbol
N
T
V
I
LTH
voltage on output pins is V
I
I
I
I
I
V
V
V
V
V
V
Respect to V
Capability (Ta = 25 C) ................................... 1.0W
CC1
CC2
SB
LI
LO
DR
ZAP
END
with Respect to V
IL
IH
OL1
OH1
OL2
OH2
= +1.8V to +6.0V, unless otherwise specified.
(3)
(3)
(3)(4)
(3)
(3)
(3)
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Power Supply Current
(Operating Write)
Power Supply Current
(Operating Read)
Power Supply Current
(Standby)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
SS
(1)
Parameter
.................. –2.0V to +V
SS ................................
Parameter
CC
+0.5V, which may overshoot to V
(2)
........................ 100 mA
100,000
–2.0V to +7.0V
2000
Min.
100
100
CC
V
V
V
CC
CC
CC
+2.0V
Min.
-1
x 0.7
- 0.8
-0.2
Max.
CC
+2.0V for periods of less than 20 ns.
2
Limits
Typ.
Cycles/Byte
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
Units
Years
Volts
mA
V
V
CC
CC
Max.
0.4
0.2
10
2
0
2
3
+ 0.5
x 0.3
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Reference Test Method
Units
CC
mA
mA
V
V
V
V
V
V
A
A
A
+1V.
V
SO=open; CS=Vss
V
F
CS = V
V
V
CS = 0V
1.8V V
I
I
OL
OH
CLK
CC
CC
IN
OUT
4.5V V
I
I
Test Conditions
= 150 A
OL
OH
= V
= -100 A
= 5V @ 5MHz
= 5.5V
= 5MHz
= 0V to V
= 3.0mA
CC
SS
= -1.6mA
CC
<2.7V
or V
CC
<5.5V
CC
CC
,