5962-8959837MZA E2V, 5962-8959837MZA Datasheet - Page 5

• Manufacturer Part Number: 5962-8959837MZA
• Manufacturer: E2V

Specifications of 5962-8959837MZA

• Lead Free Status / Rohs Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
VA 22201; http://www.jedec.org.)
text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations
unless a specific exemption has been obtained.
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device
class M.
cannot be implemented due to test equipment limitations, alternate test patterns to accomplish the same results shall be
allowed. For device class M, alternate test patterns shall be maintained under document revision level control by the
manufacturer and shall be made available to the preparing or acquiring activity upon request. For device classes Q and V
alternate test patterns shall be under the control of the device manufacturer's Technology Review Board (TRB) in accordance
with MIL-PRF-38535 and shall be made available to the preparing or acquiring activity upon request.
only. Each coated microcircuit inspection lot (see inspection lot as defined in MIL-PRF-38535) shall be subjected to and pass
the internal moisture content test at 5000 ppm (see method 1018 of MIL-STD-883). The frequency of the internal water vapor
testing shall not be decreased unless approved by the preparing activity for class M. The TRB will ascertain the requirements
as provided by MIL-PRF-38535 for classes Q and V. Samples may be pulled any time after seal.
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the
full case operating temperature range.
electrical tests for each subgroup are defined in table I.
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the
manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA
designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking
for device class M shall be in accordance with MIL-PRF-38535, appendix A.
in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate
of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103
(see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for
this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-
38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
ELECTRONICS INDUSTRIES ASSOCIATION (EIA)
(Applications for copies should be addressed to the Electronics Industries Association, 2500 Wilson Boulevard, Arlington,
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Truth table. The truth table shall be as specified on figure 3.
3.2.4 Functional tests. Various functional tests used to test this device are contained in the appendix. If the test patterns
3.2.5 Die overcoat. Polyimide and silicone coatings are allowable as an overcoat on the die for alpha particle protection
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
3.1.1 Microcircuit die. For the requirements of microcircuit die, see appendix C to this document.
JEDEC Standard EIA/JESD78
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
-
IC Latch-Up Test.
SIZE
A
REVISION LEVEL
R
SHEET
5962-89598
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