FIN324CMLX Fairchild Semiconductor, FIN324CMLX Datasheet

no-image

FIN324CMLX

Manufacturer Part Number
FIN324CMLX
Description
IC SER DES 24BIT ULP 40-MLP
Manufacturer
Fairchild Semiconductor
Series
SerDes™r
Datasheet

Specifications of FIN324CMLX

Function
Serializer/Deserializer
Input Type
LVCMOS
Output Type
LVCMOS
Number Of Inputs
24
Number Of Outputs
24
Voltage - Supply
1.6 V ~ 3 V
Operating Temperature
-30°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
40-MLP
Operating Supply Voltage
3 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Maximum Output Current
10 mA
Minimum Operating Temperature
- 30 C
Resolution
320 x 240
Supply Current
5 uA
No. Of Inputs
24
No. Of Outputs
24
Supply Voltage Range
2.5V To 3V, 1.6V To 3V
Driver Case Style
MLP
No. Of Pins
40
Termination Type
SMD
Operating Temperature Range
-30°C To +85°C
Rohs Compliant
Yes
Filter Terminals
SMD
Digital Ic Case Style
MLP
Frequency
15MHz
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Data Rate
-
Lead Free Status / Rohs Status
 Details

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FIN324CMLX
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Company:
Part Number:
FIN324CMLX
Quantity:
150
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Morra, Jim
E-mail: Jim.Morra@fairchildsemi.com
Phone: 207-761-3473
Implementation of change:
Expected 1st Device Shipment Date: 2007/06/06
Earliest Year/Work Week of Changed Product: H3
Change Type Description: Die Revision
Description of Change (From): Die change
Description of Change (To): Four changes were made to the current production die with metal
mask updates. Change 1: The receiver serial clock signal was delayed to better center on the
serial data. Change 2: Internal serial interconnects were re-routed for better isolation from
transient signals. Change 3: The serial standby burst source current, IODSTBY,was increased to
improve noise immunity. The serial burst source current was increased from 130uA to 200uA
typical. The master burst standby current, IBRST_M,was increased from 1.1mA to 1.3mA
typical. Change 4: ESD robustness was improved by adding a filter to ignore ESD transient
events on the serial lines.
Reason for Change : Improve RF and ESD susceptibility.
Qual/REL Plan Numbers : Q20060318
This change was qualified by similarity in die size and power dissipation to the original
reliability qualification data. The FIN324CGFX was qualified by similarity to the
FIN24CGFX with results in F20050073. The FIN324CMLX was qualified by similarity to
the FIN24CMLX with results in F20050228.
Qualification :
The products pass qualification. See attached reports F20050073 and F20050228.
Results/Discussion
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: Morra, Jim
E-mail: Jim.Morra@fairchildsemi.com
Phone: 207-761-3473
Date Issued On : 2007/05/07
Date Created : 2007/04/25
PCN# : Q2071702
Pg. 1

Related parts for FIN324CMLX

FIN324CMLX Summary of contents

Page 1

... Qual/REL Plan Numbers : Q20060318 This change was qualified by similarity in die size and power dissipation to the original reliability qualification data. The FIN324CGFX was qualified by similarity to the FIN24CGFX with results in F20050073. The FIN324CMLX was qualified by similarity to the FIN24CMLX with results in F20050228. Qualification : The products pass qualification. See attached reports F20050073 and F20050228. ...

Page 2

... Results 0/209 1/209 1/209 FIN324CMLX Failure Code TEST ESCAPE 1000-HOURS Failure Code 0/77 0/77 0/77 Failure Code SMASHED BUMPS/PADS Failure Code Failure Code TEST ESCAPE Good Device Pg. 2 ...

Related keywords