935263595557 NXP Semiconductors, 935263595557 Datasheet - Page 67

• Manufacturer Part Number: 935263595557
• Manufacturer: NXP Semiconductors

Specifications of 935263595557

• Lead Free Status / Rohs Status: Compliant

Philips Semiconductors
16. Test information
9397 750 14231
Product data sheet
16.1 Boundary scan test
The SAF7113H has built-in logic and five dedicated pins to support boundary scan testing
which allows board testing without special hardware (nails). The SAF7113H follows the
“IEEE Std. 1149.1 - Standard Test Access Port and Boundary-Scan Architecture” set by
the Joint Test Action Group (JTAG) chaired by Philips.
The 5 special pins are Test Mode Select (TMS), Test Clock (TCK), Test Reset (TRST),
Test Data Input (TDI) and Test Data Output (TDO).
The Boundary Scan Test (BST) functions BYPASS, EXTEST, INTEST, SAMPLE, CLAMP
and IDCODE are all supported (see
found in the specification “ IEEE Std. 1149.1” . A file containing the detailed Boundary Scan
Description Language (BSDL) of the SAF7113H is available on request.
Table 80:
Instruction
BYPASS
EXTEST
SAMPLE
CLAMP
IDCODE
INTEST
USER1
Fig 41. Oscillator application
a. With quartz crystal
Order number: Philips 4322 143 05291
quartz (3rd harmonic)
24.576 MHz
C =
10 pF
C =
10 pF
BST instructions supported by the SAF7113H
Description
This mandatory instruction provides a minimum length serial path (1 bit) between
pins TDI and TDO when no test operation of the component is required.
This mandatory instruction allows testing of off-chip circuitry and board level
interconnections.
This mandatory instruction can be used to take a sample of the inputs during
normal operation of the component. It can also be used to preload data values into
the latched outputs of the boundary scan register.
This optional instruction is useful for testing when not all ICs have BST. This
instruction addresses the bypass register while the boundary scan register is in
external test mode.
This optional instruction will provide information on the components manufacturer,
part number and version number.
This optional instruction allows testing of the internal logic (no support for
customers available).
This private instruction allows testing by the manufacturer (no support for
customers available).
L = 10 H ± 20 %
C =
1 nF
XTALI
XTAL
Rev. 03 — 9 May 2005
31
32
SAF7113H
001aac246
Table
80). Details about the JTAG BST-test can be
b. With external clock
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
9-bit video input processor
XTALI
XTAL
SAF7113H
31
32
SAF7113H
001aac247
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