GS8162Z36BGD-200 GSI TECHNOLOGY, GS8162Z36BGD-200 Datasheet - Page 6

• Manufacturer Part Number: GS8162Z36BGD-200
• Manufacturer: GSI TECHNOLOGY

Specifications of GS8162Z36BGD-200

• Density: 18Mb
• Access Time (max): 6.5ns
• Sync/async: Synchronous
• Architecture: SDR
• Clock Freq (max): 153.8MHz
• Operating Supply Voltage (typ): 2.5/3.3V
• Address Bus: 19b
• Package Type: FBGA
• Operating Temp Range: 0C to 70C
• Number Of Ports: 4
• Supply Current: 205mA
• Operating Supply Voltage (min): 2.3/3V
• Operating Supply Voltage (max): 2.7/3.6V
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 165
• Word Size: 36b
• Number Of Words: 512K
• Lead Free Status / Rohs Status: Compliant

Rev: 1.06a 10/2009
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8162Z18/36 119-Bump and 165-Bump BGA Pin Description
B
DQ
DQ
DQ
DQ
A
Symbol
, B
A
V
MCH
C,
D,
CKE
ADV
TMS
TDO
A,
B,
LBO
TCK
V
TDI
V
B
0
NC
CK
ZQ
ZZ
FT
E
E
E
DDQ
W
G
A
, B
, A
DD
DQP
DQP
DQP
SS
DQP
1
3
2
1
C
, B
A
B
C
D
D
Type
I/O
—
—
O
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
FLXDrive Output Impedance Control (Low = Low Impedance [High Drive], High = High Impedance [Low
Byte Write Enable for DQ
6/33
Address field LSBs and Address Counter Preset Inputs
Burst address counter advance enable; active high
Flow Through or Pipeline mode; active low
Linear Burst Order mode; active low
Must Connect High (165 BGA only)
Sleep mode control; active high
Clock Input Signal; active high
Data Input and Output pins
Output driver power supply
Output Enable; active low
Clock Enable; active low
Chip Enable; active high
Write Enable; active low
Chip Enable; active low
Chip Enable; active low
Scan Test Mode Select
I/O and Core Ground
Scan Test Data Out
Core power supply
Scan Test Data In
Scan Test Clock
Address Inputs
Description
No Connect
A
, DQ
Drive])
B
, DQ
C
, DQ
D
I/Os; active low
GS8162Z18/36B(B/D)
© 2004, GSI Technology
BPR1999.05.18