54FCT521LMQB. National Semiconductor, 54FCT521LMQB. Datasheet
54FCT521LMQB.
Specifications of 54FCT521LMQB.
Related parts for 54FCT521LMQB.
54FCT521LMQB. Summary of contents
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LTR A Added device type 02. Added CAGE 75569. Added case outline S. Change figure 2. Made technical change to table I. Added test circuit to figure 3. B Added device type 03. Technical changes in table I. Editorial changes ...
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SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88543 ...
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APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation ...
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Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD ...
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Test Symbol High level output voltage V OH Low level output voltage V OL Input clamp voltage V IK High level input current I IH Low level input current I IL Short circuit output current I OS Quiescent power supply ...
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TABLE I. Electrical performance characteristics - Continued Test Symbol Propagation delay time PLH1 An PHL1 6/ Propagation delay time PLH2 ...
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STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Device types 01, 02, and 03 Case outlines R, S, and 2 Terminal Terminal symbol number ...
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STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Device types 01, 02, and 03 Inputs Output Data Enable ...
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NOTES equivalent (includes test jig and probe capacitance 500Ω or equivalent 50Ω or equivalent, terminal resistance which should be equal Pulse generator ...
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VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality ...
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Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition The test circuit shall be ...
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Approved sources of supply for SMD 5962-88543 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of ...