5962-8946801YA E2V, 5962-8946801YA Datasheet - Page 19

• Manufacturer Part Number: 5962-8946801YA
• Manufacturer: E2V

Specifications of 5962-8946801YA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
has a wavelength of 2537 angstroms. The integrated dose (i.e., UV intensity x exposure time) for erasure should be a
minimum of twenty-five Ws/cm
a 12000 uW/cm
integrated dose the device can be exposed to without damage is 7258 Ws/cm
device to high intensity UV light for long periods may cause permanent damage.
made available upon request.
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be
used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC
5962) should contact DSCC-VA, telephone [phone].
[phone].
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted
by DSCC-VA.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-
4.4 Erasing procedure. The recommended erasure procedure for the device is exposure to shortwave ultraviolet light which
4.5 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1)
(2)
(3)
(4)
DEFENSE SUPPLY CENTER COLUMBUS
The devices selected for testing shall be programmed per 3.2.3.1 herein. After completion of testing, the devices
shall be erased and verified (except devices submitted for group D testing).
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
MICROCIRCUIT DRAWING
A
COLUMBUS, OHIO 43218-3990
2
= +125°C, minimum.
power rating. The device should be placed within one inch of the lamp tubes during erasure. The maximum
STANDARD
2
. The erasure time with this dosage is approximately 35 minutes using an ultraviolet lamp with
SIZE
A
2
(1 week at 12000 uW/cm
REVISION LEVEL
C
2
). Exposure of the
SHEET
5962-89468
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