5962-9061102YA E2V, 5962-9061102YA Datasheet - Page 16

• Manufacturer Part Number: 5962-9061102YA
• Manufacturer: E2V

Specifications of 5962-9061102YA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
of 2,537 Angstroms (Ä). The integrated dose (i.e., ultraviolet intensity times exposure time) for erasure should be minimum of 25
Ws/cm 2 . The erasure time with this dosage is approximately 35 minutes using an ultraviolet lamp with a 12,000 µW/cm 2 power
rating. The device should be placed within 1 inch of the lamp tubes during erasure. The maximum integrated dose the device can
be exposed to without damage is 7,258 Ws/cm 2 (1 week at 12,000 µW/cm 2 ). Exposure of the device to high intensity ultraviolet
light for long periods may cause permanent damage.
available upon request.
(original equipment), design applications, and logistics purposes.
prepared specification or drawing.
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be
used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC
5962) should contact DSCC-VA, telephone [phone].
[phone].
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by
DSCC-VA.
4.4 Erasing procedure. The recommended erasure procedure is exposure to shortwave ultraviolet light which has a wavelength
4.5 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be made
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
1/ (*) indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using high speed testers.
3/ (**) see 4.3.1c.
4/ Subgroup 7 functional tests shall verify that no cells are programmed for
STANDARD
Final electrical test parameters
Group A test requirements
Groups C and D end-point electrical
parameters (method 5005)
Interim electrical parameters
(method 5004)
(method 5005)
unprogrammed devices, and that the altered item drawing pattern exists
for programmed devices, or that the devices comply with 3.2.3.1 herein.
(method 5004)
MIL-STD-883 test requirements
TABLE II. Electrical test requirements.
SIZE
Subgroups (in accordance with
A
MIL-STD-883, method 5005,
1, 2, 3, 4**, 7, 8A, 8B,
1*, 2, 3, 7*, 8A, 8B,
2, 3, 7, 8A, 8B
9, 10, 11
9, 10, 11
REVISION LEVEL
table I)
1
B
SHEET
5962-90611
16