5962-8766105XA E2V, 5962-8766105XA Datasheet - Page 10

• Manufacturer Part Number: 5962-8766105XA
• Manufacturer: E2V

Specifications of 5962-8766105XA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
made available upon request.
made available upon request.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
4.4 Erasing procedures. The recommended erasing procedure shall be as specified by the device manufacturer and shall be
4.5 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C
d. All devices selected for testing shall have a checkerboard pattern or equivalent. After completion of all testing, the
e. Subgroups 7, 8A, and 8B shall include verification of the truth table.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
c. All devices selected for testing shall be programmed with a checkerboard pattern, then verified and erased.
which may affect capacitance. Sample size is fifteen devices with no failures and all input and output terminals tested.
devices shall be verified and erased (except devices submitted for groups C and D testing).
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
(2) T
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
control and shall be made available to the preparing activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
MICROCIRCUIT DRAWING
A
COLUMBUS, OHIO 43218-3990
= +125C, minimum.
IN
STANDARD
and C
1/ * Indicates PDA applies to subgroups 1.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ ** See 4.3.1c.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point electrical
parameters (method 5005)
MIL-STD-883 test requirements
(method 5004)
(method 5004)
(method 5005)
OUT
measurement) shall be measured only for the initial test and after process or design changes
TABLE II. Electrical test requirements. 1/ 2/ 3/
Subgroups (in accordance with
method 5005, table I)
1*, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 4**, 7, 8A, 8B, 9, 10, 11
SIZE
A
2, 8A, 10
1, 2, 3
---
or
REVISION LEVEL
G
SHEET
5962-87661
10