DEBB33D222KA2B Murata Electronics North America, DEBB33D222KA2B Datasheet - Page 58
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DEBB33D222KA2B
Manufacturer Part Number
DEBB33D222KA2B
Description
CAP CER 2200PF 2KVDC B RAD
Manufacturer
Murata Electronics North America
Series
DEBr
Specifications of DEBB33D222KA2B
Capacitance
2200pF
Voltage - Rated
2000V (2kV)
Tolerance
±10%
Temperature Coefficient
B
Mounting Type
Through Hole
Operating Temperature
-25°C ~ 85°C
Features
High Voltage
Applications
General Purpose
Package / Case
Radial - Disc
Size / Dimension
0.394" Dia (10mm)
Thickness
5.00mm Max
Lead Spacing
0.197" (5.00mm)
Lead Style
Straight
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Ratings
-
Other names
490-4274
11
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
56
No.
13
14
15
16 Life
*
*
DEF Series Specifications and Test Methods
1
2
"room condition" Temperature: 15 to 35°C, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
"C" expresses nominal capacitance value (pF).
Continued from the preceding page.
Soldering Effect
(On-Preheat)
Temperature
and Immersion
Cycle
Humidity (Under
Steady State)
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
Dielectric Strength
(Between Lead
Wires)
Appearance
Capacitance
Change
Q
I.R.
Dielectric Strength
(Between Lead
Wires)
Appearance
Capacitance
Change
Q
I.R.
Appearance
Capacitance
Change
Q
I.R.
No marked defect
Within ±2.5%
Per item 4.
No marked defect
Within ±3%
200+10C*
275+5/2C*
350 min. (30pF min.)
2000MΩ min.
Per item 4.
No marked defect
Within ±5%
200+10C*
275+5/2C*
350 min. (30pF min.)
1000MΩ min.
No marked defect
Within ±3%
200+10C*
275+5/2C*
350 min. (30pF min.)
2000MΩ min.
2
2
2
min. (10pF under)
2
min. (10pF under)
2
min. (10pF under)
2
min. (10pF min. and 30pF under)
min. (10pF min. and 30pF under)
min. (10pF min. and 30pF under)
Specifications
First the capacitor should be
stored at 120+0/-5°C for
60+0/-5 sec.
Then, as in figure, the lead wires
should be immersed in solder of
260+0/-5°C up to 1.5 to 2.0mm
from the root of terminal for
7.5+0/-1 sec.
Post-treatment: Capacitor should be stored for 1 to 2 hrs. at
The capacitor should be subjected to 5 temperature cycles,
then consecutively to 2 immersion cycles.
<Temperature Cycle>
<Immersion Cycle>
Post-treatment: Capacitor should be stored for 4 to 24 hrs. at
Set the capacitor for 500 +24/-0 hrs. at 40±2°C in 90 to 95%
relative humidity.
Post-treatment: Capacitor should be stored for 1 to 2 hrs. at
Apply 6.3kVp-p at the frequency in Table for 1000+48/-0 hrs. at
105±2°C with a relative humidity of 50% max.
(Charge/Discharge currentV50mA.)
<Frequency>
Post-treatment: Capacitor should be stored for 1 to 2 hrs. at
Step
Capacitance (pF)
1
2
12 to 22
27 to 47
to 10
Temperature (°C)
Step
room condition*
room condition*
room condition*
room condition*
65+5/-0
1
2
3
4
0±3
Temperature (°C)
Test Method
Room Temp.
Room Temp.
Frequency (kHz)
105±3
-25±3
Time (min)
1
1
1
1
.
.
.
.
100
15
15
45
33
Cycle time: 5 cycle
Cycle time: 2 cycle
Thermal
Screen
Immersion Water
Time (min)
Clean water
Salt water
30
30
3
3
Capacitor
Molten
Solder
1.5
to 2.0mm
C85E.pdf
08.10.29