08051A151JAT2A AVX Corporation, 08051A151JAT2A Datasheet - Page 2
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08051A151JAT2A
Manufacturer Part Number
08051A151JAT2A
Description
CAP CERM 150PF 5% 100V NP0 0805
Manufacturer
AVX Corporation
Specifications of 08051A151JAT2A
Capacitance
150pF
Package / Case
0805 (2012 Metric)
Voltage - Rated
100V
Tolerance
±5%
Temperature Coefficient
C0G, NP0
Mounting Type
Surface Mount, MLCC
Operating Temperature
-55°C ~ 125°C
Applications
General Purpose
Size / Dimension
0.079" L x 0.049" W (2.00mm x 1.25mm)
Thickness
0.94mm Max
Tolerance (+ Or -)
5%
Voltage
100VDC
Temp Coeff (dielectric)
C0G
Operating Temp Range
-55C to 125C
Mounting Style
Surface Mount
Construction
SMT Chip
Case Style
Ceramic Chip
Failure Rate
Not Required
Wire Form
Not Required
Product Length (mm)
2.01mm
Product Depth (mm)
1.25mm
Product Height (mm)
0.94mm
Product Diameter (mm)
Not Requiredmm
Dielectric Characteristic
C0G / NP0
Capacitance Tolerance
± 5%
Voltage Rating
100VDC
Capacitor Case Style
0805
No. Of Pins
2
Capacitor Mounting
SMD
Rohs Compliant
Yes
Brand/series
AVX
Case Size
0805
Dielectric Strength
No breakdown or visual defects
Insulation Resistance
100000 Megohms
Length
0.079 in. ± 0.008 in.
Material, Element
Ceramic
Package Type
0805
Temperature, Operating, Maximum
125 °C
Temperature, Operating, Minimum
-55 °C
Termination
SMT
Voltage, Rating
100 VDC
Width
0.049 in. ± 0.008 in.
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Ratings
-
Lead Spacing
-
Lead Free Status / Rohs Status
RoHS Compliant part
Other names
478-1285-2
C0G (NP0) Dielectric
Specifications and Test Methods
Resistance to
Resistance to
Operating Temperature Range
Solder Heat
Load Life
Humidity
Stresses
Thermal
Flexure
Shock
Load
Insulation Resistance
Dielectric Strength
Parameter/Test
Capacitance
Solderability
Q
(C=Nominal Cap)
Capacitance
Capacitance
Capacitance
Capacitance
Capacitance
Appearance
Appearance
Appearance
Appearance
Appearance
Resistance
Resistance
Resistance
Resistance
Resistance
Insulation
Insulation
Insulation
Insulation
Insulation
Dielectric
Dielectric
Dielectric
Dielectric
Variation
Variation
Strength
Variation
Strength
Variation
Strength
Variation
Strength
Q
Q
Q
Q
Q
No defects, <25% leaching of either end terminal
≥ 95% of each terminal should be covered
≥10 pF, <30 pF:
≥10 pF, <30 pF:
≤ ±2.5% or ±.25 pF, whichever is greater
≤ ±2.5% or ±.25 pF, whichever is greater
≤ ±3.0% or ± .3 pF, whichever is greater
≤ ±5.0% or ± .5 pF, whichever is greater
±5% or ±.5 pF, whichever is greater
<30 pF: Q≥ 400+20 x Cap Value
No breakdown or visual defects
≥ Initial Value x 0.3 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
100,000MΩ or 1000MΩ - μF,
NP0 Specification Limits
≥ 30 pF:
≥ 30 pF:
Within specified tolerance
<10 pF:
<10 pF:
≥ Initial Value x 0.3
No visual defects
≥30 pF: Q≥ 1000
-55ºC to +125ºC
whichever is less
with fresh solder
No visual defects
No visual defects
No defects
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
1-5 seconds, w/charge and discharge current
seconds. Store at room temperature for 24 ± 2
Charge device with 300% of rated voltage for
hours before measuring electrical properties.
Dip device in eutectic solder at 260ºC for 60
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
Repeat for 5 cycles and measure after
24 hours at room temperature
Remove from test chamber and stabilize at
Dip device in eutectic solder at 230 ± 5ºC
85% ± 5% relative humidity for 1000 hours
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
Store in a test chamber set at 85ºC ± 2ºC/
Note: Charge device with 150% of rated
Charge device with twice rated voltage in
Remove from chamber and stabilize at
Charge device with rated voltage for
(+48, -0) with rated voltage applied.
60 ± 5 secs @ room temp/humidity
room temperature for 24 ± 2 hours
test chamber set at 125ºC ± 2ºC
room temperature for 24 hours
Temperature Cycle Chamber
1.0 kHz ± 10% for cap > 1000 pF
voltage for 500V devices.
Measuring Conditions
for 1000 hours (+48, -0).
Voltage: 1.0Vrms ± .2V
Test Time: 30 seconds
limited to 50 mA (max)
for 5.0 ± 0.5 seconds
before measuring.
before measuring.
Deflection: 2mm
90 mm
1mm/sec
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
5