SW500007 Microchip Technology, SW500007 Datasheet - Page 180

• Manufacturer Part Number: SW500007
• Description: PICC-18 PRO
• Manufacturer: Microchip Technology
• Type: Compilerr
• Series: PIC18r

Specifications of SW500007

• Supported Families: PIC18
• Core Architecture: PIC
• Software Edition: Professional
• Kit Contents: Software And Docs
• Mcu Supported Families: PIC18
• Tool Function: Compiler
• Tool Type: Compiler
• Lead Free Status / RoHS Status: Not applicable / RoHS Compliant
• For Use With/related Products: PIC18 Series
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 015P; 778-1002; 778-1002

__RAM_CELL_TEST
Synopsis
Description
Should not be called from user code. This routine is called from a loop within the generated runtime
startup code if the system requires a RAM integrity test before program execution. Upon entry to
this routine, the FSR0 register has been loaded with the RAM cell to test. The value 0x55 will
be assigned to the cell and verified, followed by 0xAA. If either of these values fail verification,
the routine will call ram_test_failed() with an error code in the working register and FSR0 still
containing the address that was in error.
in sequence. If the location being tested contains non volatile data, the value will be backed up in
the PRODL register before the test routine is called and restored upon return from the routine.
insufficient for a particular system’s verification.
See also
ram_test_failed()
166
This routine is called repeatedly during startup, with each subsequent call testing the next address
This library routine can be overriden by a user’s implementation if the standard cell tests are
void _ram_cell_test(void)
Library Functions